REVIEW
|
doi:10.20944/preprints202201.0448.v1
Subject:
Chemistry And Materials Science,
Applied Chemistry
Keywords:
4H-SiC; Schottky barrier diodes; defects; DLTS
Online: 31 January 2022 (11:09:16 CET)
REVIEW
|
doi:10.20944/preprints202201.0360.v1
Online: 24 January 2022 (14:21:56 CET)
REVIEW
|
doi:10.20944/preprints202201.0290.v1
Subject:
Chemistry And Materials Science,
Applied Chemistry
Keywords:
Schottky barrier diodes; 4H-SiC; radiation; detection
Online: 20 January 2022 (08:38:21 CET)
ARTICLE
|
doi:10.20944/preprints202110.0423.v1
Online: 27 October 2021 (18:23:02 CEST)