Qualification of Photovoltaic Micromodules via Time-Domain Reflectometry Signature Testing for Energy-Harvesting Applications: A Novel Methodology

This work addresses the qualification of photovoltaic micromodules intended for energy-harvesting applications in Internet of Things systems and proposes a novel qualification method based on highresolution electronic signature masks obtained through Time-Domain Reflectometry. The method applies frequency-to-time conversion of measured S11 parameters acquired using a Vector Network Analyzer under laboratory conditions. Accelerated reliability testing is employed as a sample preparation stage to validate the proposed qualification approach and to contextualize micromodules within a framework beyond existing regulatory standards, which currently exclude PV devices below 5 Wp. The qualification method based on pass/fail TDR signature masks demonstrated in this study has the potential to become a powerful tool for quality inspection of photovoltaic micromodules by assessing deterioration over time. The research introduces TDR technology—traditionally associated with high-frequency telecommunications—into the photovoltaic contex for research and development, manufacturing inspection, and certification purposes.