Working Paper Article Version 1 This version is not peer-reviewed

Tuning the Electrical Parameters of p-NiOx Based Thin Film Transistors (Tfts) by Pulsed Laser Irradiation

Version 1 : Received: 14 March 2021 / Approved: 16 March 2021 / Online: 16 March 2021 (14:56:55 CET)

How to cite: Manojreddy, P.; Itapu, S.; Ravali, J.K.; S, S. Tuning the Electrical Parameters of p-NiOx Based Thin Film Transistors (Tfts) by Pulsed Laser Irradiation. Preprints 2021, 2021030429 Manojreddy, P.; Itapu, S.; Ravali, J.K.; S, S. Tuning the Electrical Parameters of p-NiOx Based Thin Film Transistors (Tfts) by Pulsed Laser Irradiation. Preprints 2021, 2021030429

Abstract

We utilized laser irradiation as a potential technique in tuning the electrical performance of NiOx/SiO2 thin film transistors (TFTs). By optimizing the laser fluence and the number of laser pulses, the TFT performance is evaluated in terms of mobility, threshold voltage, on/off current ratio and subthreshold swing, all of which were derived from the transfer and output characteristics. The 500 laser pulses irradiated NiOx/SiO2 TFT exhibited an enhanced mobility of 3 cm2/V-s from a value of 1.25 cm2/V-s for as-deposited NiOx/SiO2 TFT. The laser-irradiated NiOx material likely has a significant concentration of defect gap states, which could also be involved in light absorption processes. Second, and more importantly, the excess energy that the photogenerated charge carriers possess (due to the significant difference between the photon energy and the bandgap of NiOx), combined with the very high light intensity, would result in complex thermal and photo thermal changes thus resulting in an enhanced electrical performance of p-type NiOx/SiO2 TFT structure.

Subject Areas

Laser irradiation; p-type NiO; SiO2 layer; Thin film transistor

Comments (0)

We encourage comments and feedback from a broad range of readers. See criteria for comments and our diversity statement.

Leave a public comment
Send a private comment to the author(s)
Views 0
Downloads 0
Comments 0
Metrics 0


×
Alerts
Notify me about updates to this article or when a peer-reviewed version is published.
We use cookies on our website to ensure you get the best experience.
Read more about our cookies here.