In-Situ Coherent X-Ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

Anton Davydok; Thomas W. Cornelius; Zhe Ren; Cedric Leclere; Gilbert Chahine; Tobias Schülli; Florian Lauraux; Gunter Richter; Olivier Thomas

doi:10.20944/preprints201809.0359.v1

A peer-reviewed article of this Preprint also exists.

Davydok, A.; Cornelius, T.W.; Ren, Z.; Leclere, C.; Chahine, G.; Schülli, T.; Lauraux, F.; Richter, G.; Thomas, O. In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification. Quantum Beam Sci. 2018, 2, 24. Davydok, A.; Cornelius, T.W.; Ren, Z.; Leclere, C.; Chahine, G.; Schülli, T.; Lauraux, F.; Richter, G.; Thomas, O. In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification. Quantum Beam Sci. 2018, 2, 24.

Abstract

The three-point bending behavior of a single Au nanowire deformed with an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. While three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves, they were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire is visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion is detected. Bending and torsion angles are quantified from the high resolution diffraction data.

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In-Situ Coherent X-Ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

Abstract

Keywords

Subject

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