Submitted:
25 September 2025
Posted:
26 September 2025
You are already at the latest version
Abstract
Keywords:
1. Introduction
2. Photovoltaic Systems and Their Degradation
3. Literature Review
3.1. Hidden Markov Models
3.2. Factor Analysis
3.3. Regression Analysis
3.4. Markov Chain Monte Carlo with Probabilistic Programming
3.5. Reinforcement Learning
3.6. Deep Learning
3.7. Supervised Learning
3.8. Cluster Analysis
4. Selection of Degradation Models
4.1. Basic Models
4.1.1. Linear Regression
4.1.2. Quadratic Regression
4.1.3. Poisson Regression
4.1.4. Weibull Model
4.2. Mid-Advanced Methods
4.2.1. Linear Model
4.2.2. Generalized Linear Model (GLM)
4.2.3. Hierarchical Generalized Linear Model
4.3. Advanced Methods
4.4. MCMC Sampling with brms and Model Evaluation
4.5. Visualization of Models





4.6. Analysis of Models
4.7. Regression Models: Residuals and Coefficients
4.8. Weibull Model Compared to Regression
4.9. Three Types of Linear Models
4.10. Comparing Basic Models to Advanced Models
4.11. Markov Chain Monte Carlo Models
5. Comparing Usage of Different Libraries in R
5.1. Comparing Advanced Models to Previous Models
6. Model Performance Comparison
7. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
Abbreviations
| PV | Photovoltaic |
| AIC | Akaike Information Criterion |
| BIC | Bayesian Information Criterion |
| WAIC | Widely Applicable Information Criterion |
| MCMC | Markov Chain Monte Carlo |
| HMM | Hidden Markov Model |
| GLM | Generalized Linear Model |
| HGLM | Hierarchical Generalized Linear Model |
| brms | Bayesian Regression Models using Stan |
| RStan | R Interface to Stan for Bayesian Inference |
| DC | Direct Current |
| AC | Alternating Current |
| ESS | Effective Sample Size |
| IRT | Infrared Thermography |
| APC | Article Processing Charge |
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| Cause | Problem |
|---|---|
| Potential-Induced Degradation [9] | Ion migration and conductive paths |
| Aging and Environmental Factors [10] | Premature deterioration |
| Hot and Humid Climates [11] | Delamination and diode/box issues |
| Improper Tooling and Maintenance [12] | Damage to components |
| Light-Induced Degradation [13] | Loss of its rated wattage output |
| Bypass Diode Fault | Leakage current under temperatures |
| Method | Technique | References |
|---|---|---|
| Dynamic prediction | Hidden Markov Models | [26,27,28,29,30] |
| Statistical inference | Factor Analysis, Regression Analysis, MCMC with probabilistic programming | Factor Analysis [31,32,33,35], Regression Analysis [11,34,35], MCMC [36,37] |
| Machine Learning | Reinforcement learning, Deep Learning, Supervised learning, Cluster Analysis | Reinforcement learning [38,39,40,41], Deep Learning [8,42,43], Supervised learning [44,45], Cluster Analysis [46,47] |
| Model Type | Prediction Goal | Mathematical Formula |
|---|---|---|
| Linear Regression | Predicts continuous response variables (e.g., efficiency) based on predictors. | |
| Quadratic Regression | Captures non-linear relationships by including squared terms of predictors. | |
| Poisson Regression | Models count data related to degradation events (e.g., number of failures). | |
| Weibull Model | Analyzes time-to-event outcomes related to degradation (e.g., lifespan). | |
| Generalized Linear Model | Examines complex data structures with various response distributions. | |
| Hierarchical Linear Model | Accounts for nested data structures and variability among groups. |
| Criterion | Basic Models | Linear Models | Advanced Models |
|---|---|---|---|
| AIC | 1545.032 (Weibull) to ∞ (Pois reg) | ∼14,195.6 | (MCMC RStan) |
| BIC | 1556.42 (Weibull), ∞ (Pois reg) | ∼14,219.82 | (MCMC RStan) |
| WAIC | 1543.032 (Weibull), ∞ (Pois reg) | ∼14,193.6 | – |
| Comparison | Basic Models | Linear Models | Advanced Models |
|---|---|---|---|
| Basic vs. Linear Models | Basic models demonstrate significantly lower AIC, BIC, and WAIC values, indicating a better fit. | Linear models show high values across all criteria, suggesting they may not be suitable for the data. | The stark contrast in fit metrics suggests that basic models are preferable over linear models. |
| Basic vs. Advanced Models | Basic models outperform advanced models in AIC, BIC, and WAIC, with MCMC RStan showing extremely high values. | Advanced models, particularly MCMC RStan, do not provide a better fit than basic models. The high values for advanced models suggest they may not be necessary given the performance of basic models. | |
| Linear vs. Advanced Models | Linear models show high AIC, BIC, and WAIC values, similar to advanced models. | Advanced models do not significantly outperform linear models based on the provided metrics. The performance of both model types suggests that neither is particularly effective for the dataset. |
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