Submitted:
30 August 2024
Posted:
03 September 2024
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Abstract
Keywords:
1. Introduction
2. Materials and Methods

3. Result
4. Discussion
5. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
References
- Granqvist, C.G. Electrochromics for smart windows: oxide-based thin films and devices. Thin Solid Films 2014, 564, 1–38. [Google Scholar] [CrossRef]
- Ismaeel, N.T.; Lábadi, Z.; Petrik, P.; Fried, M. Investigation of Electrochromic, Combinatorial TiO2-SnO2 Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models. Materials 2023, 16, 4204. [Google Scholar] [CrossRef] [PubMed]
- Zoltán Lábadi, Dániel Takács, Zsolt Zolnai, Péter Petrik and Miklós Fried, Compositional Optimization of Sputtered WO3/MoO3 Films for High Coloration Efficiency, Materials 2024, 17(5), 1000. [CrossRef]
- Zimmer, A.; Gilliot, M.; Broch, L.; Boulanger, C.; Stein, N.; Horwat, D. Morphological and chemical dynamics upon electrochemical cyclic sodiation of electrochromic tungsten oxide coatings extracted by in situ ellipsometry. Applied Optics 2020, 59, 3766–3772. [Google Scholar] [CrossRef] [PubMed]
- Hale, J.S.; DeVries, M.; Dworak, B.; Woollam, J.A. Visible and infrared optical constants of electrochromic materials for emissivity modulation applications. Thin Solid Film 1998, 313, 205–209. [Google Scholar] [CrossRef]
- Sauvet, K.; Rougier, A.; Sauques, L. Electrochromic WO3 thin films active in the IR region. Sol. Energy Mater. Sol. Cells 2008, 92, 209–215. [Google Scholar] [CrossRef]
- Shan, A.; Fried, M.; Juhasz, G.; Major, C.; Polgár, O.; Németh, Á.; Petrik, P.; Dahal, L.R.; Chen, J.; Huang, Z. High-speed imaging/mapping spectroscopic ellipsometry for in-line analysis of roll-to-roll thin-film photovoltaics. IEEE J. Photovolt. 2014, 4, 355–361. [Google Scholar] [CrossRef]
- Koirala, P.; Tan, X.; Li, J.; Podraza, N.J.; Marsillac, S.; Rockett, A.; Collins, R.W. Mapping spectroscopic ellipsometry of CdTe solar cells for property-performance correlations. In Proceedings of the 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), Denver, CO, USA, 8–13 June 2014; pp. 674–679. [Google Scholar] [CrossRef]
- Dahal, L.R.; Li, J.; Stoke, J.A.; Huang, Z.; Shan, A.; Ferlauto, A.S.; Wronski, C.R.; Collins, R.W.; Podraza, N.J. Applications of real-time and mapping spectroscopic ellipsometry for process development and optimization in hydrogenated silicon thin-film photovoltaics technology. Sol. Energy Mater. Sol. Cells 2014, 129, 32–56. [Google Scholar] [CrossRef]
- Aryal, P.; Pradhan, P.; Attygalle, D.; Ibdah, A.-R.; Aryal, K.; Ranjan, V.; Marsillac, S.; Podraza, N.J.; Collins, R.W. Real-time, in-line, and mapping spectroscopic ellipsometry for applications in Cu (in Ga) Se metrology. IEEE J. Photovolt. 2014, 4, 333–339. [Google Scholar] [CrossRef]
- Petrik, P.; Fried, M. Mapping and Imaging of Thin Films on Large Surfaces: A review. Phys. Status Solidi 2022, 219, 2100800. [Google Scholar] [CrossRef]
- Fried, M.; Bogar, R.; Takacs, D.; Labadi, Z.; Horvath, Z.E.; Zolnai, Z. Investigation of Combinatorial WO3-MoO3 Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models. Nanomaterials 2022, 12, 2421. [Google Scholar] [CrossRef] [PubMed]
- Fei Wang, Jia Jia, Wei Zhao, Lan Zhang, Huizhong Ma, Na Li, Yunlong Chen, Preparation and electrochromic properties of NiO and ZnO-doped NiO thin films, Materials Science in Semiconductor Processing, Volume 151, 15 November 2022, 106986. [CrossRef]
- Sharma, S.; Kumar, N.; Makgwane, P.R.; Chauhan, N.S.; Kumari, K.; Rani, M.; Maken, S. TiO2/SnO2 nano-composite: New insights in synthetic, structural, optical and photocatalytic aspects. Inorg. Chim. Acta 2022, 529, 120640. [Google Scholar] [CrossRef]
- Rajput, R.B.; Jamble, S.N.; Kale, R.B. A review on TiO2/SnO2 heterostructures as a photocatalyst for the degradation of dyes and organic pollutants. J. Environ. Manag. 2022, 307, 114533. [Google Scholar] [CrossRef] [PubMed]
- Fujiwara, H. Spectroscopic Ellipsometry Principles and Applications; John Wiley & Sons: Hoboken, NJ, USA, 2007, Print ISBN 9780470016084; Online ISBN 9780470060193.




| ZnO (%) | 400 nm | 500 nm | 600 nm | 700 nm | 800 nm |
|---|---|---|---|---|---|
| 2 | 17.2 | 7.9 | 5.1 | 2.9 | 1.8 |
| 5 | 15.7 | 4.4 | 2.7 | 1.9 | 1.3 |
| 10 | 10.5 | 5.0 | 3.5 | 3.0 | 3.1 |
| 15 | 6.4 | 3.7 | 1.3 | 0.4 | 0.5 |
| 21.6 | 22.0 | 13.8 | 9.3 | 6.4 | 5.8 |
| 29.3 | 46.1 | 32.5 | 30.0 | 23.7 | 21.5 |
| 36.2 | 28.3 | 19.5 | 14.6 | 12.5 | 10.1 |
| 41.6 | 18.9 | 11.6 | 7.7 | 5.2 | 3.9 |
| 51.4 | 27.3 | 14.6 | 10.3 | 7.8 | 6.0 |
| 59.5 | 25.9 | 11.9 | 9.2 | 6.9 | 5.6 |
| 69 | 16.4 | 9.7 | 7.3 | 6.6 | 4.6 |
| 77 | 15.7 | 11.5 | 9.1 | 7.6 | 5.5 |
| 85 | 10.0 | 5.7 | 4.8 | 5.1 | 3.1 |
| 93 | 4.1 | 0.2 | 1.3 | 1.2 | 1.2 |
| 99 | 6.8 | 4.0 | 2.8 | 3.2 | 1.4 |
| 100 | 6.5 | 3.3 | 1.0 | 2.6 | 1.6 |
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