2.2. Tester Development
Low frequency tester
The low-frequency shielding effectiveness tester consists of two parts of a flanged coaxial line with air dielectric. Signals are fed through an N-type plug panel mount coaxial connector. Internally, a transition from Teflon (or polyethylene) dielectric wave-guide to air dielectric coaxial is formed after the connector. After the dielectric type transition, the narrow coaxial transmission line gradually changes to a wider one where, at final dimensions, it maintains a 50 ohm impedance. The broader part of the coaxial is extended and terminated with a flange , allowing both sides to be connected and held together. The dimensions of the coaxial extension determine the highest measured frequency. For the first 3D printed prototype, the dimensions closely match the standard ASTM tester and the cutoff frequency is 1.75GHz
The shielding effectiveness test probe structure is shown on
Figure 1. The diameter of the inner conductor at the base of the coaxial line with air dielectric is 5mm and the inner diameter of the outer conductor is 11.7mm, which provides 50 Ohm characteristic impedance, then it linearly extends to larger area coaxial maintaining 50 Ohm characteristic impedance with dimensions of 32.75mm inner and 76mm outer conductor. The total length of the tester for both parts is 356mm.
The shielding effectiveness tester main structure was 3D printed out of PLA to reduce cost, weight and verify feasibility of shielding effectiveness tester
Figure 1. As the base of the print was oriented on the flanges which naturally are as flat as the printer heat bed the flat side tester halves were sanded as the printer is not accurate enough to allow the parts to fit very tightly together which is where signal leakage could occur. The inner conductive parts were laminated with 50
thick copper tape with conductive adhesive. End N-type panel mount connectors of the tester pressed in between sides and secured with screws, the center conductor is tightly pressed on the end of the connector centre conductor additionally the center is supported and held in place with foam ring. The specimen is inserted between the parts and secured by screwing it together with nylon bolts and nuts or compressing the two sections together with foldback clips as the area is enough to allow to use multiple strong foldback clips.
For characterization of the shielding effectiveness tester, it is necessary to create short circuit and matched or in this case empty circuits where no device under test is placed inside of tester. In a short-circuit, instead of the material sample, a well-conducting material is placed, such as a in our example a 0.5mm thick copper plate, which will create a short-circuit between the parts of the shielding effectiveness tester itself and the two VNA ports. A matched circuit would mean that the entire signal flows through perfectly and no signal attenuation is performed, this will be achieved by connecting the two parts of the shielding effectiveness tester together with no material inserted, paying attention to make the best possible contact between the two sections of the shielding effectiveness tester. As the created coaxial shielding effectiveness tester is not ideal the pass-through signal has some attenuation by itself and it is taken as the reference. The difference between S21 reference and S21 shorted will show the maximum dynamic range and the maximum measurable shielding effectiveness of the system. The measurements were made with ZNB20 2 port vector network analyzer the measurement system block diagram is shown in
Figure 5. Both pass trough attenuation and copper plate short circuit is shown in
Figure 2. The signal pass trough attenuation of the shielding effectiveness tester is about 0.7dB which means that no large obstructions are in the path of the signal in combination with short circuit measurement the system gives about 75dB dynamic range.
To analyse the quality of the structure in detail Tektronix DSA8200 digital serial analyser with 80E04 time domain reflectometry sampling module was used.
Figure 2b show module in series with minicircuts 141-3SM+ cable which at point 1 connects to SMA plug to N-type jack adapter (1-2) where in which occurs the first dip of 42
.Part 2-3 is panel mount connector (Amphenol N6551A1-NT3G-50) which has good 50
impedance. The next dip of 40
at point 4 is the start of the taper which gradually smooths out as the dimensions get larger, at point 5 which is the end of the taper a small positive impedance jump is visible after that the coaxial line is about 51 OHM till the flange open end at point 6.
High frequency tester
Formula 10 shows that reducing the dimensions of the shielding effectiveness tester the transverse electromagnetic wave mode cutoff frequency increases, while using formula 9 dimensions can be found where coaxial line maintains 50 Ohm characteristic impedance. It is convenient to already use the existing properties of the N-type connector, where the interconnections internally form air coaxial transitions. By elongating these transitions and making a wider flange connection space, we create a similar shielding effectiveness tester layout as the previous one, but which works at higher frequencies.
At the base of the tester the inner coaxial conductor is a 3.18mm diameter rod with a 1.27mm diameter and approximately 10mm deep hole on one side, this hole is intended to connect the rod to the inner conductor of the N-type connector, after the hole a taper starts to a larger coaxial where the center conductors diameter reaches 5.77mm. The base of the outer conductor has a 8.31mm hole where the N-type jack to N-type plug adapter (Amphenol 172276), plug part is designed to screw on and create a continuous transition of the coaxial line. The inner conductors 3.18mm diameter with adapter outer conductor 7.32mm diameter forms an accurate 50 transmission line. After that the outer part tapers to 13.31mm which with 5.77mm inner conductor keeps 50.1 impedance. At the end the outer part of the tester expands to 30.48mm diameter flange for material testing.
Similar as the low frequency tester the high frequency tester was fabricated using the 3D printer. As the parts dimensions are smaller inaccuracies have higher impact on final transmission line impedance’s to mitigate it the nozzle of the printer was reduced to 0.2mm. Same as the low frequency tester the each side consists of two lobes which before copper tape lamination were sanded to ensure tight fit. The center conductor is held in place with 3D printed ring. This smaller test mock-up will allow testing of materials up to approximately 10GHz frequency, with a smaller sample of material to be used, which facilitates and simplifies the testing of new materials. Using less material is beneficial for testing more expensive or difficult to obtain materials.
To determine the quality of produced shielding effectiveness tester prototype its scatter parameter were taken when there are no material present and with 0.5mm copper plate. The signal passtrough attenuation up to 6GHz is relativeley small reaching only 2dB, in frequency region from 6 to 8GHz the increase in attenuation is larger reaching 5.6dB. Meanwhile the the measurement with double sided FR4 board signal attenuation reached 78-82dB which gives the aproximate dynamic range of about 70dB visible in
Figure 4a.
Figure 4b time domain reflectometry shows again that the SMA to N-type plug connector point 1-2 has a 40
dip. After that the N-type jack to plug adapter part in points 2-3 of the tester has 50 ohm impedance. After the adapter the narrow part of the coaxial line starts with lower impedance which reaches the lowest point at the start of the taper in point 4 where it drops to 40
. In the middle of the taper points 4-5 the impedance reaches 50
and lowers at the end of ti at point 5. Trough out rest of the coaxial line the impedance is not stable dipping and rising until the end of the tester at point 6. Part of why the impedance are lower would be explainable by the actual applied tape layer thickness and the end print properties. As the print is not exactly level but has a ribbed relief from print layer structure and the applied tape sits on top of the layer ribs as well as in some places there are multiple layer of tape in which case the clearance is reduced further and these differences in dimansions on smaller device leads to larger differences in impedance mismatch causing lower impedances on avarage.