Preprint Communication Version 1 Preserved in Portico This version is not peer-reviewed

Controlled Creation of Contact Cracks in Additive Manufactured Components

Version 1 : Received: 3 October 2023 / Approved: 3 October 2023 / Online: 3 October 2023 (14:23:42 CEST)

A peer-reviewed article of this Preprint also exists.

Preston, D.; Ashour, A.; Wright, J.; Watts, J.; Sanmartin, D.; Wood, J. Controlled Creation of Contact Cracks in Additive Manufactured Components. Appl. Sci. 2023, 13, 11990. Preston, D.; Ashour, A.; Wright, J.; Watts, J.; Sanmartin, D.; Wood, J. Controlled Creation of Contact Cracks in Additive Manufactured Components. Appl. Sci. 2023, 13, 11990.

Abstract

Techniques for the controlled seeding and growth of cracks are urgently required for non-destructive testing technique evaluation, particularly for additive manufactured (AM) samples. This paper describes a method which uses a combination of tensile load and resonance excitation of notched AM samples, with in-situ monitoring of the resonance frequency serving to track crack dimensions. Mechanical low-cycle fatigue cracks, ranging in length from ~0.3 mm to ~5 mm, are successfully created in five AM samples using this technique. The samples are non-destructively characterized using optical microscopy and Nonlinear Resonance (NLR) testing. The exploitation of resonance enables the concentration of a significant number of stress cycles on the samples in much shorter timespans than conventional fatigue testing, enabling high throughput, while utilising compact components. Furthermore, the tracking of resonance frequency shift throughout the process enables non-invasive and non-contact real-time condition monitoring.

Keywords

Non-destructive testing; Cracks; Contact Cracks; Resonance; Flaw Seeding; Nonlinear; Nonlinear Resonance; Reference Samples

Subject

Engineering, Other

Comments (0)

We encourage comments and feedback from a broad range of readers. See criteria for comments and our Diversity statement.

Leave a public comment
Send a private comment to the author(s)
* All users must log in before leaving a comment
Views 0
Downloads 0
Comments 0
Metrics 0


×
Alerts
Notify me about updates to this article or when a peer-reviewed version is published.
We use cookies on our website to ensure you get the best experience.
Read more about our cookies here.