Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Experimental investigation of the Metasurfaced Reverberation Chamber

Hengyi Sun
* ORCID logo ,
Zhuo Li
,
Changqing Gu
,
Qian Xu
,
Yaoran Zhang
,
Zhengran Xu
,
Xiaoping Luo
,
Changjiang Sun
,
Alfred Chan
Version 1 : Received: 28 September 2023 / Approved: 28 September 2023 / Online: 3 October 2023 (03:41:59 CEST)

A peer-reviewed article of this Preprint also exists.

Sun, H.; Li, Z.; Gu, C.; Xu, Q.; Zhang, Y.; Xu, Z.; Luo, X.; Sun, C.; Chan, A. Experimental Investigation of the Metasurfaced Reverberation Chamber. Electronics 2023, 12, 4985, doi:10.3390/electronics12244985. Sun, H.; Li, Z.; Gu, C.; Xu, Q.; Zhang, Y.; Xu, Z.; Luo, X.; Sun, C.; Chan, A. Experimental Investigation of the Metasurfaced Reverberation Chamber. Electronics 2023, 12, 4985, doi:10.3390/electronics12244985.

Abstract

To verify the concept of the metasurfaced reverberation chamber (MRC) which was proposed. This paper reports on measurements in the reverberation chamber (RC) performance by using a 1-bit random coding metasurfaced stirrer. The measurement results are validated and compared with that from two mechanical stirrers (horizontal stirrer and vertical stirrer). Figures of merit such as quality factor (Q factor), number of samples, standard deviation, angle autocorrelation, average K-factor, total scattering cross section (TSCS) and the enhanced back scattering coefficient (eb) are presented. Results indicate the feasibility of the MRC technique in the operation frequency of the RC. And it is possible to enlarge the test volume of the RC by using the 1-bit random coding metasurface stirrer.

Keywords

Metasurface; Reverberation Chamber; Q factor; K factor; Total Scattering Cross Section

Subject

Engineering, Electrical and Electronic Engineering

Copyright: This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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