A/D Conversion with Oversample and Average Based Precision Improvement

Gilberto Mendes; Luis Miguel Pires

doi:10.20944/preprints202306.1523.v1

Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Version 1 : Received: 21 June 2023 / Approved: 21 June 2023 / Online: 21 June 2023 (10:18:49 CEST)

This paper presents high-resolution digital measurements at low cost, combining oversample and averaging. Experiments of processing data between samples and between multiple temperature sensors in the same environment are conducted. They provide results with effective increase in the analog to digital converter bits, in correspondence with the minimization on the effects of noise. It is shown that averaging a set of small, low-cost sensors at a small microcontroller can give flexible access to improved measurement accuracy.

oversample; average; microcontroller; thermistor; low-cost

Engineering, Electrical and Electronic Engineering

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A/D Conversion with Oversample and Average Based Precision Improvement

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