Preprint Review Version 1 Preserved in Portico This version is not peer-reviewed

The Development of iDPC-STEM and Its Application in Electron Beam Sensitive Materials

Version 1 : Received: 5 May 2022 / Approved: 9 May 2022 / Online: 9 May 2022 (09:56:01 CEST)

A peer-reviewed article of this Preprint also exists.

Wang, H.; Liu, L.; Wang, J.; Li, C.; Hou, J.; Zheng, K. The Development of iDPC-STEM and Its Application in Electron Beam Sensitive Materials. Molecules 2022, 27, 3829. Wang, H.; Liu, L.; Wang, J.; Li, C.; Hou, J.; Zheng, K. The Development of iDPC-STEM and Its Application in Electron Beam Sensitive Materials. Molecules 2022, 27, 3829.

Journal reference: Molecules 2022, 27, 3829
DOI: 10.3390/molecules27123829

Abstract

The main aspects of material research: material synthesis, material structure, and material properties, are interrelated. Acquiring atomic structure information of electron beam sensitive materials by electron microscope, such as porous zeolites, organic-inorganic hybrid perovskites, metal-organic frameworks, is an important and challenging task. The difficulties in characterization of the structures will inevitably limit the optimization of their synthesis methods and further improve their performance. The emergence of integrated differential phase contrast scanning transmission electron microscopy (iDPC-STEM), a STEM characterization technique capable of obtaining images with high signal-to-noise ratio under lower doses, has made great breakthroughs in the atomic structure characterization of these materials. This article reviews the developments and applications of iDPC-STEM in electron beam sensitive materials, and provides an outlook on its capabilities and development.

Keywords

electron beam sensitive materials; electron microscopic characterization; low dose; iDPC-STEM

Subject

PHYSICAL SCIENCES, Condensed Matter Physics

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