Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Secrecy Analysis and Error Probability of LIS-aided Communication Systems under Nakagami-m Fading

Version 1 : Received: 10 August 2021 / Approved: 11 August 2021 / Online: 11 August 2021 (10:52:46 CEST)

A peer-reviewed article of this Preprint also exists.

Ferreira, R.C.; Facina, M.S.P.; de Figueiredo, F.A.P.; Fraidenraich, G.; de Lima, E.R. Secrecy Analysis and Error Probability of LIS-Aided Communication Systems under Nakagami-m Fading. Entropy 2021, 23, 1284. Ferreira, R.C.; Facina, M.S.P.; de Figueiredo, F.A.P.; Fraidenraich, G.; de Lima, E.R. Secrecy Analysis and Error Probability of LIS-Aided Communication Systems under Nakagami-m Fading. Entropy 2021, 23, 1284.

Abstract

In this work, we derive the spectral efficiency, secrecy outage probability, and bit error rate of a communication system assisted by a large intelligent surface (LIS). We consider a single-antenna user and an array of antennas at the transmitter side and the possibility of a direct link between transmitter and receiver. Additionally, there is a single-antenna eavesdropper with a direct link to the transmitter, which is modeled as a Nakagami-m distributed fading coefficient. The channels from transmitter to the LIS and from the LIS to the user may or may not have the line-of-sight (LoS) and are modeled by the Nakagami- m distribution. Moreover, we assume that the LIS elements perform non-ideal phase cancellation leading to a residual phase error that assumes a Von Mises distribution. We show that the resulting channel can be accurately approximated by a Gamma distribution whose parameters are analytically estimated using the moments of the equivalent signal-to-noise ratio. We also provide an upper bound for the error probability for M-QAM modulations. With the derived formulas, we analyze the effect of the strength of the LoS link by varying the Nakagami parameter, m.

Keywords

Large intelligent surfaces; 6G; bit error probability; Nakagami fading; Von Mises distribution

Subject

Engineering, Electrical and Electronic Engineering

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