Version 1
: Received: 21 December 2018 / Approved: 25 December 2018 / Online: 25 December 2018 (08:40:43 CET)
How to cite:
Yuste, M.; Escobar-Galindo, R.; Benito, N.; Palacio, C.; Martinez, O.; Albella, J.M.; Sánchez, O. Effect of the Incorporation of Titanium on the Optical Properties of ZnO Thin Films: From Doping to Mixed Oxide Formation. Preprints2018, 2018120298. https://doi.org/10.20944/preprints201812.0298.v1
Yuste, M.; Escobar-Galindo, R.; Benito, N.; Palacio, C.; Martinez, O.; Albella, J.M.; Sánchez, O. Effect of the Incorporation of Titanium on the Optical Properties of ZnO Thin Films: From Doping to Mixed Oxide Formation. Preprints 2018, 2018120298. https://doi.org/10.20944/preprints201812.0298.v1
Yuste, M.; Escobar-Galindo, R.; Benito, N.; Palacio, C.; Martinez, O.; Albella, J.M.; Sánchez, O. Effect of the Incorporation of Titanium on the Optical Properties of ZnO Thin Films: From Doping to Mixed Oxide Formation. Preprints2018, 2018120298. https://doi.org/10.20944/preprints201812.0298.v1
APA Style
Yuste, M., Escobar-Galindo, R., Benito, N., Palacio, C., Martinez, O., Albella, J.M., & Sánchez, O. (2018). Effect of the Incorporation of Titanium on the Optical Properties of ZnO Thin Films: From Doping to Mixed Oxide Formation. Preprints. https://doi.org/10.20944/preprints201812.0298.v1
Chicago/Turabian Style
Yuste, M., Jose Maria Albella and Olga Sánchez. 2018 "Effect of the Incorporation of Titanium on the Optical Properties of ZnO Thin Films: From Doping to Mixed Oxide Formation" Preprints. https://doi.org/10.20944/preprints201812.0298.v1
Abstract
ZnO films with Ti atoms incorporated (TZO) in a wide range (0-18 at. %) have been grown by reactive co-sputtering on silicon and glass substrates. The influence of the titanium incorporation in the ZnO matrix on the structural and optical characteristics of the samples has been determined by Rutherford backscattering spectroscopy (RBS), X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD). The results indicate that the samples with low Ti content (< 4 at. %) exhibit the wurtzite-like structure, with the Ti+4 ions substitutionally incorporated into the ZnO structure, forming Ti-doped ZnO films. In particular, very low concentration of Ti (<0.9 at. %) leads to a significant increase of the crystallinity of the TZO samples. Higher Ti contents give rise to a progressive amorphization of the wurtzite-like structure so samples with high Ti content (≥18at. %), displays an amorphous structure indicating the XPS analysis a predominance of Ti-O-Zn mixed oxides. The energy gap, obtained from absorption spectrophotometry, increases from 3.2 eV for pure ZnO films to 3.6 eV for those with the highest Ti content. Ti incorporation in the ZnO samples below 0.9 at. % rises both, the blue (380 nm) and green (550 nm) bands of the photoluminescence (PL) emission, thereby indicating a significant improvement of PL efficiency of the samples.
Keywords
Ti doped ZnO, Thin film, Co-Sputtering, UV-Visible
Subject
Chemistry and Materials Science, Surfaces, Coatings and Films
Copyright:
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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