ARTICLE | doi:10.20944/preprints202303.0478.v1
Subject: Computer Science And Mathematics, Applied Mathematics Keywords: active filters; filtering theory; low-pass filter; voltage followers; pole frequency; quality factor; frequency response
Online: 28 March 2023 (09:26:54 CEST)
A new low-pass filter (LPF) circuit with independent adjustment of various, incl. digitally controlled, pole frequency resistors, pole quality factor and transmission coefficient. The proposed low-pass filter is based on the use of the properties of a multi-differential operational amplifier that performs the functions of a signal adder. The peculiarity of the filter is that it has three inputs, with respect to which different transmission coefficients are implemented, incl. inverting (-1) and non-inverting (+1). To check these properties of a low-pass filter in the Micro-Cap environment, computer simulation of a specific circuit was performed on a multi-differential operational amplifier AD 8130. Mathematical expressions are given for the main parameters of the proposed low-pass filter, which allow parametric synthesis of elements of a specific circuit under given restrictions on the used element base.
ARTICLE | doi:10.20944/preprints202303.0467.v1
Subject: Engineering, Electrical And Electronic Engineering Keywords: active filters; filtering theory; low-pass filter; voltage followers; pole frequency; quality factor; frequency response
Online: 28 March 2023 (02:29:28 CEST)
A new circuit of a low-pass filter (LPF) is considered, which is switched on at the input of analog-to-digital converters to limit the spectrum of input signals. The peculiarity of the proposed low-pass filter is the independent adjustment of the pole frequency, the quality factor of the pole and the transmission coefficient by different resistors. Computer simulation performed in the Micro-Cap environment confirms these properties of the LPF. The basic mathematical expressions are obtained, which make it possible to carry out the parametric synthesis of the LPF circuit. It is shown that the sensitivity of the LPF transmission coefficient to changes in the parameters of the frequency-setting elements of the circuit is close to zero and depends only on the ratio of the resistances of the two resistors in the feedback circuit.
ARTICLE | doi:10.20944/preprints202301.0525.v1
Subject: Chemistry And Materials Science, Metals, Alloys And Metallurgy Keywords: electron beam treatment; aluminum-silicon alloy; deformation inhomogeneities; surface hardening
Online: 28 January 2023 (09:47:13 CET)
: The paper presents the results of uniaxial tensile tests of samples of hypoeutectic aluminum-silicon alloy A319. According to the results of which the influence of surface treatment by a pulsed electron beam on the mechanical properties of the material was determined. The peculiarities of localization of deformation in the material, caused by grinding of the surface layer material structure due to rapid crystallization during electron beam treatment were revealed. The surface treatment up to 100 µm depth leads to the formation of a fine dendritic columnar structure of silumin and to an increase in the plasticity of the samples. The influence of surface treatment affects the increase of deformation localization in the region of stable concentrator before failure. The largest increase in ductility and localization of deformation occurs during processing with energy density of 15 J/cm2. In the process of specimen deformation, unstable, metastable, and stable areas of plastic deformation localization are formed and replaced, and the formation of stable areas of localized plastic deformation, in which the specimen fails at the end of the test, can be detected at the initial stages of testing. In specimens, during testing in the zone of localized plastic deformation, bands are formed that pass through the entire surface of the specimen at an angle from 35 to 55 degrees to the axis of tension, their evolution leads to the formation of stable zones of localized plastic deformation and to the failure of the specimen.