Submitted:
05 March 2025
Posted:
05 March 2025
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Abstract
Keywords:
1. Introduction
2. Materials and Methods
2.1. Instruments and Deceives
- Hot plat with magnetic stirring (HS-3000, S/N 0407-13, Camlab Ltd., Cambridge B24 5WE, UK) for heating and mixing as required.
- Four-digit analytical microbalance (Model SEJ-205, Taipei-Taiwan) for high accuracy weighting.
- pH meter (EUTEGH, Serial Number 897911, part of Thermos Scientific, Republic of Singapore, Singapore) for solutions pH measurement.
- Scanning electron microscope (SEM) (Inspect F50-FEI company, Eindhoven, The Netherlands) for high magnification and resolution imaging.
- Agar sputter coater instrument (Agar Scientific, Model AGB7340, Essex, UK) for specimens coating.
- Vacuum oven (JEIO TECH, MODEL OV-11, AAH13115K, Republic of Korea, Seoul) for drying under vacuum.
- Centrifugate system (HERMILE Labortechnik GmbH, Type Z 326 K, REF 311.00 V05, SN 66A1800211, Wehingen, Germany) for powder separation.
- Tube furnace (Protherm alumina tube furnace, Model PTF 12/50/450, serial No. 0907234, Protherm Inc, Ankara, Turkey) with a combined home-designed argon gas line and vacuum fitting for powder sintering.
- Digital caliper (Total, TMT 322001, Guangzhou, China) for high accuracy dimension measurements.
- Milling machine with variable speed (Changsha Tiachuang, Powder Technology Co., Changsha, China) for milling process.
- Compaction system consists of a homemade stainless-steel die integrated with a CARVER press (model 4350. L, S/N 4350-1401, CARVER, INC., Wabash, IN, USA) for powder compaction.
- Electron-Beam evaporation system (SCT-1800, SCT, System Control Technologies, sctec.com, Battle Ground, WA 98604, USA) for thin film deposition.
- UV–Visible spectrophotometer (UV-1601 (PC) S, CAT No. 206-67501-93, SERIAL No. A1077-3300310S2, Shimadzu Corporation, Tokyo, Japan) for optical properties investigation.
- Optical reflectance Spectrometer (FilmTek 3000, Scientific Computing International, Carlsbad, CA, USA) spectrometer for thin film thickness measurements.
- Fourier Transform Infrared Spectroscopy (FTIR, NEXUS, EPS-87, Thermo Fisher Scientific, Waltham, MA) in the wavenumber range of 400–4000 cm-1 for powder and thin film FTIR tests.
- X-ray diffraction (XRD) instrument (Malvern Panalytical, Aeris, monochromatic Cu kα1, 1.5406 Å, 0.02 step angle, with 2θ ranging from 10◦—60◦, Almelo, The Netherlands) for phase and unit cell investigation.
2.2. Materials
2.3. Production of Na2S Compound
2.4. Synthesis of ZnS
2.5. Sintering of ZnS Powder
2.6. Thin Film Deposition and UV–Visible Spectrophotometry
2.7. Characterizations of the Starting Powders, Synthesized ZnS, and ZnS Thin Films
3. Result and Discussion
3.1. SEM of Zn Powder, S Powder, and Synthetized ZnS Investigations
3.2. SEM Images of sintered ZnS Powder
3.3. Thin Film Microstructure at High Magnification
3.4. UV-Visible and FTIR Spectroscopy of the Produced ZnS
3.4.1. UV-Visible of the Thin Film Samples
3.4.2. FTIR of ZnS Powder and its Thin Film
4. Conclusions
Author Contributions
Funding
Acknowledgments
Conflicts of Interest
Data Availability Statement
References
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| Sample No. | ρg. (g/cm3) | ρs. (g/cm3) | Compaction and sintering conditions |
| 1 | 2.64 | 3.19 | Compaction pressure 400 MPa, sintering temp. 400 oC for 8h under an Argon atmosphere with a flow rate of approximately 1 L/min., heating rates of 5 oC/min., furnace cool. |
| 2 | 2.61 | 3.15 | |
| 3 | 2.69 | 3.32 | |
| 4 | 2.61 | 3.18 | |
| Mean Value | 2.64 | 3.21 |
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