Submitted:
02 December 2024
Posted:
04 December 2024
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Abstract
The foundational theorems of DFT require, for its correct application, the use of the ground state charge density of a material for calculating its electronic and related properties. The à priori unknown nature of this ground state charge density points to the incomplete nature of the seminal DFT. Mainstream calculations have mostly assumed that results obtained with self-consistent iterations using a single basis set represent the ground state of a material; such results are stationary states among an infinite number of such states – with no relation to the ground state of the material under study. The Completion of DFT [AIP Advance, 4, 127104 (2014)] entailed (a) the introduction of the second corollary to the first DFT theorem and (b) the methodical search for and attainment of the ground state of a material with successive, self-consistent calculations with progressively augmented basis sets. With (a) and (b), the completed density functional theory (cDFT) has unfailingly and accurately predicted properties of several materials and described electronic and related properties of dozens of semiconductors, including their band gaps. The cDFT does not invoke a self-interaction correction or a derivative discontinuity of the exchange-correlation energy. It does not utilize ad hoc potentials. Results of cDFT calculations possess the full physical content of the theory and are in accord with corresponding, experimental ones; they clearly indicate that objectives of the Materials Genome Initiative (MGI) can be reached with a widespread utilization of cDFT [MRS Advances 8, 619-625 (2023)].
Keywords:
1. Introduction
2. The Incompleteness of The Original Dft
3. The Completed DfT (cDFT)
4. Recommendations for Using cDFT
4.1. cDFT Functional
4.2. Ad hoc Potentials
4.3. The Need for Exponential and Gaussian Functions and the Attainment of the Ground State
4.4. The Role of Funding Sources and of Journals
5. Illustrative Results from cDFT
| Material |
DFT Potential |
Number of Calculated Gaps | Ranges of Calculated Gaps | Experimental Gaps | DFT BZW orBZW-EF Gaps |
|---|---|---|---|---|---|
| Cubic InN | LDA & GGA | 10 | -0.55 - + 0.08 | 0.61 eV | 0.65 eV18 |
| c-Mg2Si | LDA &GGA | 10 | 0.12 – 0.42 | 0.65 – 0.80 eV | 0.89 eV20 |
| w-AlN | LDA & GGA | 11 | 3.9 – 4.78 eV | 6.2 – 6.2 ±0.2 eV | 6.28 eV21 |
| zb-ZnS | LDA & GGA | 5 | 1.65 – 2.37 eV | 3.723 eV | 3.725 eV22 |
| w-GaN | LDA & GGA | 17 | 1.68 – 2.52 eV | 3.3-3.5 eV | 3.20 & 3.29 eV23 |
| w-BeO | LDA | 9 | 7.0 – 7.8 eV | 10.24 – 10.630.10 eV | 10.3 eV24 |
| Rutile TiO2 | LDA & GGA | 18 | 1.67 – 2.12 eV | 3.00 – 3.10 eV | 2.95 & 3.05 eV12 |
| w-ZnO | LDA | 12 | 0.23 – 2.26 eV | 3.30 – 3.40 eV | 3.39 eV8 |
| zb-BP | LDA & GGA | 15 | 1.11 – 1.38 eV | 2.02±0.05 eV | 2.02 eV25 |
| c-BN | LDA & GGA | 9 | 4.20 – 4.47 eV | 6.20 – 6.4±0.5 eV | 6.48 eV26 |
6. Conclusions
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
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