Preprint
Article

Advanced Visitor Profiling for Personalized Museum Experiences Using Telemetry-Driven Smart Badges

This version is not peer-reviewed.

Preprints.org logo

Preprints.org is a free preprint server supported by MDPI in Basel, Switzerland.

Subscribe

Disclaimer

Terms of Use

Privacy Policy

© 2025 MDPI (Basel, Switzerland) unless otherwise stated