Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Towards High Lift-Off Non-contact Railway Track Crack Detection with Eddy Current Sensor Array Technology

Version 1 : Received: 2 April 2024 / Approved: 2 April 2024 / Online: 2 April 2024 (12:19:56 CEST)

How to cite: Shao, Y.; Xia, Z.; Ding, Y.; Crocker, B.; Saunders, S.; Peyton, A.; Conniffe, D.; Yin, W. Towards High Lift-Off Non-contact Railway Track Crack Detection with Eddy Current Sensor Array Technology. Preprints 2024, 2024040196. https://doi.org/10.20944/preprints202404.0196.v1 Shao, Y.; Xia, Z.; Ding, Y.; Crocker, B.; Saunders, S.; Peyton, A.; Conniffe, D.; Yin, W. Towards High Lift-Off Non-contact Railway Track Crack Detection with Eddy Current Sensor Array Technology. Preprints 2024, 2024040196. https://doi.org/10.20944/preprints202404.0196.v1

Abstract

A reliable and efficient rail track defect detection system is essential for maintaining rail track integrity and avoiding safety hazards and financial losses. Eddy current (EC) testing is a non-destructive technique that can be employed for this purpose. The trade-off between spatial resolution and lift-off should be carefully considered in practical applications to distinguish closely spaced cracks such as those caused by rolling contact fatigue (RCF). A multi-channel eddy current sensor array has been developed to detect defects on rails. Based on the sensor scanning data, defect reconstruction along the rails is achieved using an inverse algorithm that includes both direct and iterative approaches. In experimental evaluations, the EC system with the developed sensor is used to measure defects on a standard test piece of rail with a probe lift-off of 4-6 mm. The reconstruction results clearly reveal cracks at various depths and spacings on the test piece.

Keywords

eddy current testing; electromagnetic induction; planar structure; theoretical calculation; measurement

Subject

Engineering, Electrical and Electronic Engineering

Comments (0)

We encourage comments and feedback from a broad range of readers. See criteria for comments and our Diversity statement.

Leave a public comment
Send a private comment to the author(s)
* All users must log in before leaving a comment
Views 0
Downloads 0
Comments 0


×
Alerts
Notify me about updates to this article or when a peer-reviewed version is published.
We use cookies on our website to ensure you get the best experience.
Read more about our cookies here.