Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Towards Enhancing Automated Defect Detection (ADR) in Digital X-ray Radiography Applications: Synthesizing Training Data Through X-ray Intensity Distribution Modeling for Deep Learning Algorithms

Version 1 : Received: 5 December 2023 / Approved: 6 December 2023 / Online: 6 December 2023 (04:00:32 CET)

A peer-reviewed article of this Preprint also exists.

Hena, B.; Wei, Z.; Perron, L.; Castanedo, C.I.; Maldague, X. Towards Enhancing Automated Defect Recognition (ADR) in Digital X-ray Radiography Applications: Synthesizing Training Data through X-ray Intensity Distribution Modeling for Deep Learning Algorithms. Information 2024, 15, 16. Hena, B.; Wei, Z.; Perron, L.; Castanedo, C.I.; Maldague, X. Towards Enhancing Automated Defect Recognition (ADR) in Digital X-ray Radiography Applications: Synthesizing Training Data through X-ray Intensity Distribution Modeling for Deep Learning Algorithms. Information 2024, 15, 16.

Abstract

Industrial radiography is a pivotal non-destructive testing (NDT) method that ensures quality and safety in a wide range of industrial sectors. Conventional human-based approaches, however, are prone to challenges in defect detection accuracy and efficiency, primarily due to the high inspection demand from manufacturing industries with high production throughput. To solve this challenge, numerous computer-based alternatives have been developed, including Auto-mated Defect Recognition (ADR) using deep learning algorithms. At the core of training, these algorithms demand large volumes of data that should be representative of real-world cases. However, the availability of digital X-ray radiography data for open research is limited by non-disclosure contractual terms in the industry. This study presents a pipeline that is capable of modeling synthetic images based on statistical information acquired from X-ray intensity distribution from real digital X-ray radiography images. Through meticulous analysis of the intensity distribution in digital X-ray images, the unique statistical patterns associated with the exposure conditions used during image acquisition, type of component, thickness variations, beam divergence, anode heel effect, etc., are extracted. The realized synthetic images were utilized to train deep learning models, yielding an impressive model performance with mean intersection over union (IoU) of 0.93, and mean dice coefficient of 0.96, on real unseen digital X-ray radiography images. This methodology is scalable and adaptable, making it suitable for diverse industrial applications.

Keywords

non-destructive testing; synthetic data; deep learning; automated defect recognition (ADR); digital X-ray radiography

Subject

Engineering, Industrial and Manufacturing Engineering

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