Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Charge Resolution Study on AMS-02 Silicon Layer-0 Prototype

Version 1 : Received: 9 November 2023 / Approved: 9 November 2023 / Online: 10 November 2023 (08:09:06 CET)

A peer-reviewed article of this Preprint also exists.

Ubaldi, A.; Graziani, M. Charge Resolution Study on AMS-02 Silicon Layer-0 Prototype. Instruments 2023, 7, 45. Ubaldi, A.; Graziani, M. Charge Resolution Study on AMS-02 Silicon Layer-0 Prototype. Instruments 2023, 7, 45.

Abstract

The work presented in this paper represents a preliminary study on the performance of the new Silicon tracker layer, the Layer 0 (L0), that will be installed on top of the Alpha Magnetic Spectrometer (AMS-02), at the end of 2024. AMS-02 is a cosmic rays (CR) detector that has been operating on the International Space Stations (ISS) since May 2011. Thanks to its 9-layer Silicon tracker, this apparatus can perform high energy CR measurements with an unprecedented level of statistics and precision. However, high Z (Z $\ge 15$) CR nuclei statistic is strongly affected by fragmentation along the detector: with the installation of the new Silicon layer will be possible to achieve new unique high energy (TeV region) measures for those nuclei along with increased statistics for all nuclei up to Zinc. To achieve this, a Silicon ladder prototype, that will be part of the final Silicon layer, has been exposed to an ions test beam at the super-proton-synchrotron (SPS) of the CERN to characterize its charge resolution and the readout electronics. Preliminary results have shown a charge resolution of 10 $\%$ for nuclei up to Z=7.

Keywords

AMS-02 Layer 0 upgrade; Silicon micro-strips detector; nuclei; charge resolution; ADC

Subject

Physical Sciences, Astronomy and Astrophysics

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