Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

A Low-Cost Instrument for Multidimensional Characterization of Advanced Wireless Communication Technologies

Version 1 : Received: 20 April 2023 / Approved: 21 April 2023 / Online: 21 April 2023 (03:58:20 CEST)

A peer-reviewed article of this Preprint also exists.

Gounella, R.; Martins, A.; Pepino, V.; Borges, B.-H.V.; Carmo, J.P. A Low-Cost Instrument for Multidimensional Characterization of Advanced Wireless Communication Technologies. Appl. Sci. 2023, 13, 6581. Gounella, R.; Martins, A.; Pepino, V.; Borges, B.-H.V.; Carmo, J.P. A Low-Cost Instrument for Multidimensional Characterization of Advanced Wireless Communication Technologies. Appl. Sci. 2023, 13, 6581.

Abstract

3D printing is commonly used to create complex objects at a low cost. It has also been applied in the fabrication of metamaterials and metasurfaces, which alter the propagation path of electromagnetic waves. These structures have diverse applications, including enhancing beam direction, improving antenna gain and signal-to-noise ratio, and creating filters and reflectors. Metasurfaces are cheap to fabricate and their use is expected to boost antenna efficiency in 5G telecommunications and beyond. However, accurately characterizing their profile remains a significant challenge. This paper presents a low-cost fully automated 4-axis instrument for microwave metasurface charac-terization, overcoming limitations of manual methods and offering an efficient and accurate approach. This research represents a significant advancement in microwave metasurface characterization, enabling sophisticated techniques to advance wireless communication technolo-gies, as it is the case of the future 5G and millimeter-wave communication systems. The equipment has an approximate cost of $1550 USD and was able to characterize a metalens with a focal distance of 20 cm designed for signals at 30 GHz. It was possible to create 2D and 3D profiles of the intensity distribution focused by the metalens and extract parameters such as the gain (8.05 dB), 3dB depth of focus (11 cm) and full width at half maximum (2.17 cm). The comparison of the measurements with the diffraction calculations of the metalens showed a very good agreement between the in-tensity distributions and the parameters of the metalens.

Keywords

low-cost instrumentation; characterization setup; multidimensional characterization; metasurfaces; millimeter-wave

Subject

Engineering, Electrical and Electronic Engineering

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