Submitted:
25 August 2020
Posted:
26 August 2020
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Abstract
The Flack Parameter is now almost universally reported for all chiral materials characterized by X-ray crystallography. It’s elegantly simplicity was an inspired development by Flack, and although the original algorithm for its computation has been strengthened by other workers, it remains an essential outcome for any crystallographic structure determination. As with any one-parameter metric, it needs to be interpreted in the context of its standard uncertainty.
Keywords:
Howard Flack
; Flack Parameter
; Structure Analysis
; X-ray Crystallography
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