Preprint Article Version 1 This version is not peer-reviewed

Precision Permittivity Measurement for Low-Loss Thin Planar Materials Using Large Coaxial Probe from 1 to 400 MHz

Version 1 : Received: 12 October 2018 / Approved: 12 October 2018 / Online: 12 October 2018 (08:19:52 CEST)

How to cite: You, K.Y.; Sim, M.S. Precision Permittivity Measurement for Low-Loss Thin Planar Materials Using Large Coaxial Probe from 1 to 400 MHz. Preprints 2018, 2018100263 (doi: 10.20944/preprints201810.0263.v1). You, K.Y.; Sim, M.S. Precision Permittivity Measurement for Low-Loss Thin Planar Materials Using Large Coaxial Probe from 1 to 400 MHz. Preprints 2018, 2018100263 (doi: 10.20944/preprints201810.0263.v1).

Abstract

This paper focuses on the non-destructive dielectric measurement for low-loss planar materials with a thickness of less than 3 mm using a large coaxial probe with an outer diameter of 48 mm. The aperture probe calibration procedure required only to make a measurement of the half-space air and three offset shorts. The reflection coefficient for the thin material is measured using a Keysight E5071C network analyzer from 0.3 MHz to 650 MHz and then converted to a relative dielectric constant and tangent loss via closed form capacitance model and lift-off calibration process. Measurement error of dielectric constant, Δεr is less than 2.5 % from 1 MHz to 400 MHz and the resolution of loss tangent, tan δ  measurement is capable of achieving 3×10-3.

Subject Areas

large coaxial probe; thin planar materials; low-loss materials; relative permittivity; reflection coefficient; calibration

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