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Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon

This version is not peer-reviewed.

Brian K. Tanner,David Allen,Jochen Wittge,Andreas N. Danilewsky,Jorge Garagorri,

Eider Gorostegui-Colinas,Reyes M. Elizalde,

Patrick J. McNally^*

Brian K. Tanner,David Allen,Jochen Wittge,Andreas N. Danilewsky,Jorge Garagorri,

Eider Gorostegui-Colinas,Reyes M. Elizalde,

Patrick J. McNally^*

This version is not peer-reviewed.

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