ARTICLE
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doi:10.20944/preprints202304.1256.v1
Subject:
Physical Sciences,
Particle And Field Physics
Keywords:
time-of-flight mass spectrometer; electron microscope; electrostatic lens; electrostatic mirror; relativistic effect; system of singular integral equations; factorized functions; eigenfunctions; eigenvalues.
Online: 30 April 2023 (04:22:43 CEST)