Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Quantifying Visual Differences in Drought Stressed Maize through Reflectance and Data-Driven Analysis

Version 1 : Received: 28 April 2024 / Approved: 29 April 2024 / Online: 30 April 2024 (15:27:57 CEST)

How to cite: Banerjee, S.; Reynolds, J.; Taggart, M.; Daniele, M. A.; Bozkurt, A.; Lobaton, E. Quantifying Visual Differences in Drought Stressed Maize through Reflectance and Data-Driven Analysis. Preprints 2024, 2024041949. https://doi.org/10.20944/preprints202404.1949.v1 Banerjee, S.; Reynolds, J.; Taggart, M.; Daniele, M. A.; Bozkurt, A.; Lobaton, E. Quantifying Visual Differences in Drought Stressed Maize through Reflectance and Data-Driven Analysis. Preprints 2024, 2024041949. https://doi.org/10.20944/preprints202404.1949.v1

Abstract

Environmental factors, such as drought-stress, significantly impact maize growth and productivity worldwide. To improve yield and quality, effective strategies for early detection and mitigation of drought-stress in maize are essential. This paper presents a detailed analysis of three imaging trials conducted to detect drought-stress in maize plants using an existing, custom-developed, low cost, high throughput phenotyping platform. We propose a pipeline for early detection of water stress in maize plants using a Vision Transformer classifier and analysis of distributions of near-infrared (NIR) reflectance from the plants. We also explored suitable regions on the plant that are more sensitive to drought-stress and show that the region surrounding the youngest expanding leaf (YEL) and the stem can be used as a more consistent alternative to analysis involving just the YEL. Our results show good separation between well-watered and drought-stressed trials for two out of the three imaging trials both in terms of classification accuracy from data-driven features as well as through analysis of histograms of NIR reflectance.

Keywords

Crop Health Monitoring; Drought Stress Detection; Remote Sensing; Near Infrared; Pixel Extraction; Classification

Subject

Engineering, Electrical and Electronic Engineering

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