Polarimeter for Detection of Anisotropy from Reflectance

Shuji Kamegaki; Zahra Khajehsaeidimahabadi; Meguya Ryu; Nguyen Hoai An Le; Soon Hock Ng; Ričardas Buividas; Gediminas Seniutinas; Vijayakumar Anand; Saulius Juodkazis; Junko Morikawa

doi:10.20944/preprints202404.1816.v1

Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Version 1 : Received: 27 April 2024 / Approved: 28 April 2024 / Online: 28 April 2024 (05:34:20 CEST)

Polarimetry is used to determine the Stokes parameters of a laser beam. Once all four S0,1,2,3 parameters are determined, the state of polarisation is established. Upon reflection of a laser beam with the defined S polarisation state, the directly measured S parameters can be used to determine the optical properties of the surface, which modified the S-state upon reflection. Here, we demonstrate polarimetry for the determination of surface anisotropies related to birefringence and dichroism from different materials, which have a common feature of linear patterns of different alignments and scales. It is shown that polarimetry in the back-reflected light is complementary to ellipsometry and four-polarisation camera imaging.

polarimetry; anisotropy; birefringence, four-polarisation method

Physical Sciences, Optics and Photonics

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Polarimeter for Detection of Anisotropy from Reflectance

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