Extending the Depth of Focus of Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride

Molong Han; Daniel Smith; Tauno Kahro; Dominyka Stonyte; Aarne Kasikov; Darius Gailevicius; Vipin Tiwari; Agnes Pristy Ignatius Xavier; Shivasubramanian Gopinath; Soon Hock Ng; Aravind Simon John Francis Rajeswary; Aile Tamm; Kaupo Kukli; Keith Bambery; Jitraporn Vongsvivut; Saulius Juodkazis; Vijayakumar Anand

doi:10.20944/preprints202403.0471.v1

A peer-reviewed article of this Preprint also exists.

Han, M.; Smith, D.; Kahro, T.; Stonytė, D.; Kasikov, A.; Gailevičius, D.; Tiwari, V.; Ignatius Xavier, A.P.; Gopinath, S.; Ng, S.H.; John Francis Rajeswary, A.S.; Tamm, A.; Kukli, K.; Bambery, K.; Vongsvivut, J.; Juodkazis, S.; Anand, V. Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride. Micromachines 2024, 15, 537. Han, M.; Smith, D.; Kahro, T.; Stonytė, D.; Kasikov, A.; Gailevičius, D.; Tiwari, V.; Ignatius Xavier, A.P.; Gopinath, S.; Ng, S.H.; John Francis Rajeswary, A.S.; Tamm, A.; Kukli, K.; Bambery, K.; Vongsvivut, J.; Juodkazis, S.; Anand, V. Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride. Micromachines 2024, 15, 537.

Abstract

Axial resolution is one of the most important characteristics of a microscope. In all microscopes, a high axial resolution is desired in order to discriminate information efficiently along the longitudinal direction. However, when studying thick samples that do not contain laterally overlapping information, a low axial resolution is desirable as information from multiple planes can be recorded simultaneously from a single camera shot instead of plane-by-plane mechanical refocusing. In this study, we increased the focal depth of an infrared microscope non-invasively by introducing a binary axicon fabricated on barium fluoride substrate close to the sample. Preliminary results of imaging thick and sparse silk fibers showed an improved focal depth with a slight decrease in lateral resolution and increase in background noise.

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Extending the Depth of Focus of Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride

Abstract

Keywords

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