Do, Q.-H.; Antony, R.; Ratier, B.; Bouclé, J. Improving Device-to-Device Reproducibility of Light-Emitting Diodes Based on Layered Halide Perovskites. Electronics2024, 13, 1039.
Do, Q.-H.; Antony, R.; Ratier, B.; Bouclé, J. Improving Device-to-Device Reproducibility of Light-Emitting Diodes Based on Layered Halide Perovskites. Electronics 2024, 13, 1039.
Do, Q.-H.; Antony, R.; Ratier, B.; Bouclé, J. Improving Device-to-Device Reproducibility of Light-Emitting Diodes Based on Layered Halide Perovskites. Electronics2024, 13, 1039.
Do, Q.-H.; Antony, R.; Ratier, B.; Bouclé, J. Improving Device-to-Device Reproducibility of Light-Emitting Diodes Based on Layered Halide Perovskites. Electronics 2024, 13, 1039.
Abstract
Layered halide perovskites have emerged as a promising contender in solid-state lighting thanks to their tunable bandgap, high luminescence quantum yield, and high color purity. However, the fabrication of perovskite light-emitting devices in laboratories usually experiences low de-vice-to-device reproducibility since perovskite crystallization is highly sensitive to ambient condi-tions, such as humidity and temperature. Although device processing inside gloveboxes is primarily used to reduce the influence of oxygen and moisture, several extraneous variables, including gas-eous pollution traces and thermal fluctuations in the inert atmosphere or contaminations from re-sidual solvents confined in the enclosed environment, can destabilize the crystallization process and alter the properties of the emissive layers. Here, we examine different experimental set-ups for spin-coating deposition of layered perovskites in inert atmospheres and their influences on the formation of polycrystalline thin films. Our results demonstrate that fluctuations in the glovebox properties (concentrations of residual O2 and H2O or solvent traces), even in very short timescales, can negatively impact the consistency of the perovskite film formation, while thermal variation plays a relatively minor role in this phenomenon. Furthermore, careful storage of chemical species inside the workstation is critical for reproducing high-quality perovskite layers. Consequently, when applying our most controlled environment for perovskite deposition, the photoluminescence life-time of perovskite thin films shows a standard deviation of only 3%, whereas the reference set-up yields a 15% standard deviation. Regarding complete perovskite light-emitting diodes, the uncer-tainties in statistical luminance and EQE data are significantly reduced from 230% and 140% to 38% and 42%, respectively.
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