Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Effect of Oxygen Annealing Atmosphere on Structural, Electrical and Energy Storage Properties of Bi0.5Na0.5TiO3 Polycrystalline Thin Film

Version 1 : Received: 31 July 2023 / Approved: 1 August 2023 / Online: 1 August 2023 (09:52:52 CEST)

A peer-reviewed article of this Preprint also exists.

Alaoui, I.H.; Lemée, N.; Le Marrec, F.; Mebarki, M.; Cantaluppi, A.; Favry, D.; Lahmar, A. Effect of Oxygen Annealing Atmosphere on Structural, Electrical and Energy Storage Properties of Bi0.5Na0.5TiO3 Polycrystalline Thin Film. Quantum Beam Sci. 2023, 7, 29. Alaoui, I.H.; Lemée, N.; Le Marrec, F.; Mebarki, M.; Cantaluppi, A.; Favry, D.; Lahmar, A. Effect of Oxygen Annealing Atmosphere on Structural, Electrical and Energy Storage Properties of Bi0.5Na0.5TiO3 Polycrystalline Thin Film. Quantum Beam Sci. 2023, 7, 29.

Abstract

Bismuth sodium titanate thin films (BNT) were deposited on Pt/SiN substrates by Sol-Gel spin coating technique under O2 atmosphere. Microstructural, structural, and electrical properties of the obtained film were investigated. Scanning electron microscopy and atomic force microscopy micrographs were used to analyze the microstructure of the films. Furthermore, EDX analysis revealed a Na-deficient composition for the obtained film. X-ray diffraction and Raman spectroscopy allowed the identification of a pure perovskite BNT phase. Dielectric, ferroelectric, and leakage current measurements revealed good frequency stability of the dielectric constant and dielectric losses for BNT thin film. The results are discussed in terms of Na-deficiency effects on the defect structure of BNT. Further, the film showed attractive electrostatic energy storage properties with energy density that exceeds 1.04 J/cm3 under E = 630 kV/cm.

Keywords

BNT thin film; X-ray diffraction; AFM; Raman spectroscopy, Energy storage

Subject

Chemistry and Materials Science, Materials Science and Technology

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