Picos, R.; Stavrinides, S.G.; Al Chawa, M.M.; de Benito, C.; Dueñas, S.; Castan, H.; Hatzikraniotis, E.; Chua, L.O. Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map. Electronics2022, 11, 1672.
Picos, R.; Stavrinides, S.G.; Al Chawa, M.M.; de Benito, C.; Dueñas, S.; Castan, H.; Hatzikraniotis, E.; Chua, L.O. Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map. Electronics 2022, 11, 1672.
Picos, R.; Stavrinides, S.G.; Al Chawa, M.M.; de Benito, C.; Dueñas, S.; Castan, H.; Hatzikraniotis, E.; Chua, L.O. Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map. Electronics2022, 11, 1672.
Picos, R.; Stavrinides, S.G.; Al Chawa, M.M.; de Benito, C.; Dueñas, S.; Castan, H.; Hatzikraniotis, E.; Chua, L.O. Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map. Electronics 2022, 11, 1672.
Abstract
Memristors were proposed in the early ’70s of the XXth century by Leon Chua as a new electrical element linking the charge and the flux. Since that first introduction, these devices have positioned themselves to be considered as possibly fundamental for the new generations of electronic devices. It has to be mentioned that actual memristors have only been recognized to exist as physical elements. In this paper, we apply a modeling framework to generate a model describing experimental measurements performed on a ReRAM. We show how to apply the Dynamic Route Map technique in the general case to obtain an approximation to the differential equation that determines the behaviour of the device.
Keywords
Memristor; RRAM; compact modeling; Charge and Flux; Phase space
Subject
Engineering, Electrical and Electronic Engineering
Copyright:
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.