Circuit Simulation of Film Resistor Laser Trimming with a Measuring Voltage Source

Vladimir Kondrashov; Vyacheslav Chapkin; Oleg Seredin; Evgenii Zemlyakov; Ekaterina Yu. Pozdeeva

doi:10.20944/preprints202203.0028.v1

A peer-reviewed article of this Preprint also exists.

Kondrashov, V.V.; Chapkin, V.V.; Seredin, O.S.; Zemlyakov, E.V.; Pozdeeva, E.Y. Circuit Simulation of Film Resistor Laser Trimming with a Measuring Voltage Source. Electronics 2022, 11, 767. Kondrashov, V.V.; Chapkin, V.V.; Seredin, O.S.; Zemlyakov, E.V.; Pozdeeva, E.Y. Circuit Simulation of Film Resistor Laser Trimming with a Measuring Voltage Source. Electronics 2022, 11, 767.

Abstract

This paper considers the principles of building a circuit model of film resistor cutting. The conductive resistive medium is defined with the component equations and the topology of the circuit model. A method of estimating the electric parameters of a resistor operating in the system with a measuring voltage source is shown. An equation system for the node voltages is defined, and the resistive layer parameters are analyzed as the circuit model structure changes during the cutting process.

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Copyright: This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Circuit Simulation of Film Resistor Laser Trimming with a Measuring Voltage Source

Abstract

Keywords

Subject

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