San, K.K.; Washizaki, H.; Fukazawa, Y.; Honda, K.; Taga, M.; Matsuzaki, A. Deep Cross-Project Software Reliability Growth Model Using Project Similarity-Based Clustering. Mathematics2021, 9, 2945.
San, K.K.; Washizaki, H.; Fukazawa, Y.; Honda, K.; Taga, M.; Matsuzaki, A. Deep Cross-Project Software Reliability Growth Model Using Project Similarity-Based Clustering. Mathematics 2021, 9, 2945.
Abstract
Software reliability is an important characteristic for ensuring the qualities of software products. Predicting the potential number of bugs from the beginning of a development project allows practitioners to make the appropriate decisions regarding testing activities. In the initial development phases, applying traditional software reliability growth models (SRGMs) with limited past data does not always provide reliable prediction result for decision making. To overcome this, herein we propose a new software reliability modeling method called deep cross-project software reliability growth model (DC-SRGM). DC-SRGM is a cross-project prediction method that uses features of previous projects’ data through project similarity. Specifically, the proposed method applies cluster-based project selection for training data source and modeling by a deep learning method. Experiments involving 15 real datasets from a company and 11 open source software datasets show that DC-SRGM can more precisely describe the reliability of ongoing development projects than existing traditional SRGMs and the LSTM model.
Keywords
Software reliability; deep learning; long short-term memory; project similarity and clustering; cross-project prediction
Subject
MATHEMATICS & COMPUTER SCIENCE, Information Technology & Data Management
Copyright:
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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