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The Frequency Fluctuation Model for the van der Waals Broadening
Version 1
: Received: 6 October 2021 / Approved: 8 October 2021 / Online: 8 October 2021 (10:43:44 CEST)
A peer-reviewed article of this Preprint also exists.
Letunov, A.; Lisitsa, V.; Astapenko, V. The Frequency Fluctuation Model for the van der Waals Broadening. Foundations 2021, 1, 200-207. Letunov, A.; Lisitsa, V.; Astapenko, V. The Frequency Fluctuation Model for the van der Waals Broadening. Foundations 2021, 1, 200-207.
Abstract
The effect of atomic and molecular microfied dynamics on spectral line shapes is under consideration. This problem is treated in the framework of the Frequency Fluctuation Model (FFM). For the first time the FFM is tested for the broadening of a spectral line by neutral particles. The usage of the FFM allows one to derive simple analytical expressions and perform fast calculations of the intensity profile. The obtained results was compared with Chen and Takeo theory (CT), which is in a good agreement with experimental data. It was demonstrated that for moderate values of temperature and density the FFM successfully describes the effect of the microfield dynamics on a spectral line shape.
Keywords
Spectroscopy; Stark broadening; Atomic physics
Subject
Physical Sciences, Atomic and Molecular Physics
Copyright: This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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