Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Effect of Joule Heating on Cell Viability and Device Reliability

Version 1 : Received: 24 May 2021 / Approved: 25 May 2021 / Online: 25 May 2021 (08:43:36 CEST)

How to cite: Caffiyar, M.Y.; Irshad, K.; Tirth, V.; Zackria Ansar B.I, M.; Algahtani, A.; Islam, S. Effect of Joule Heating on Cell Viability and Device Reliability. Preprints 2021, 2021050591 (doi: 10.20944/preprints202105.0591.v1). Caffiyar, M.Y.; Irshad, K.; Tirth, V.; Zackria Ansar B.I, M.; Algahtani, A.; Islam, S. Effect of Joule Heating on Cell Viability and Device Reliability. Preprints 2021, 2021050591 (doi: 10.20944/preprints202105.0591.v1).

Abstract

The application of electrode-based microfluidic devices in biological entity often imposes a problem due to joule heating. The strong applied potentials or micro channels having narrow cross sections generate undesirable temperature inside the microfluidic channels leading to strong thermal distribution inside the micro channel. When intrinsic distribution of temperature, if not fix with threshold value, causes device damage or cell loss. In this work, we investigate the effects of temperature generated due to joules heating effects and we attempt to address the design constraints for minimizing the joule heating effects in the microfluidic device for developing effective microfluidic device. The device reliability was analyzed under different parametric constraints for various types of substrate materials (PDMS, PMMA, Polyimide and glass). We also attempt to investigate the effects of cell reliability due to strong temperature gradients generated through different applied potentials on different cell types. Furthermore, the response of the device performance due to different electrode configuration and different conductivity of the medium was also studied. Our investigation will eventually provide guidelines for microfluidic researchers to fabricate efficient electrode based microfluidic device which will ultimately help to choose a critical channel dimensions, threshold potentials, and conductivity of solutions in order to avoid device damage and cell loss.

Subject Areas

cell viability; device reliability; joule heating; eDEP devices.

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