Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations

Baha Sakar
* ORCID logo ,
Sibylle Sievers
ORCID logo ,
Alexander Fernández Scarioni
,
Felipe Garcia-Sanchez
ORCID logo ,
İlker Öztoprak
,
Hans Werner Schumacher
,
Osman Öztürk
Version 1 : Received: 8 May 2021 / Approved: 10 May 2021 / Online: 10 May 2021 (16:06:46 CEST)

A peer-reviewed article of this Preprint also exists.

Sakar, B.; Sievers, S.; Fernández Scarioni, A.; Garcia-Sanchez, F.; Öztoprak, İ.; Schumacher, H.W.; Öztürk, O. A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations. Magnetochemistry 2021, 7, 78. Sakar, B.; Sievers, S.; Fernández Scarioni, A.; Garcia-Sanchez, F.; Öztoprak, İ.; Schumacher, H.W.; Öztürk, O. A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations. Magnetochemistry 2021, 7, 78.

Abstract

Magnetic force microscopy (MFM) is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative (qMFM) spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack which shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process combined with a characterization of the sample micromagnetic parameters allows to reliably calculate the sample’s magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed.

Keywords

magnetic force microscopy; calibration; reference samples; micromagnetism; metrology for magnetism; magnetic Multilayers

Subject

Physical Sciences, Acoustics

Copyright: This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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