Answers to Fundamental Questions in Superresolution Microscopy

Rainer Heintzmann

doi:10.20944/preprints202104.0447.v1

Preprint Communication Version 1 Preserved in Portico This version is not peer-reviewed

Version 1 : Received: 15 April 2021 / Approved: 16 April 2021 / Online: 16 April 2021 (14:45:48 CEST)

This article presents answers to the questions on superresolution and structured illumination microscopy as raised in the editorial of a recent publication [K. Prakash et al. arXiv, 2102.13649, 2021]. The answers are based on my personal views on superresolution in light microscopy, supported by reasoning. Discussed are the definition of superresolution, Abbe’s resolution limit and the classification of superresolution methods into non-linear-, prior-knowledge- and near-field-based superresolution. A further focus is put on capabilities and technical aspects of present and future structured illumination microscopy (SIM) methods.

optics; resolution; superresolution; Ernst Abbe; structured illumination; non-linear; image scanning microscopy; total internal reflection; MINFLUX; localization microscopy

Physical Sciences, Acoustics

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Answers to Fundamental Questions in Superresolution Microscopy

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