Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Luminance Degradation Compensation Based on Multi-Stream Self-Attention to Address Thin Film Transistor-Organic Light Emitting Diode Burn-in

Version 1 : Received: 7 April 2021 / Approved: 8 April 2021 / Online: 8 April 2021 (11:05:13 CEST)
Version 2 : Received: 29 April 2021 / Approved: 29 April 2021 / Online: 29 April 2021 (09:10:06 CEST)

A peer-reviewed article of this Preprint also exists.

Park, S.; Park, K.-H.; Chang, J.-H. Luminance-Degradation Compensation Based on Multistream Self-Attention to Address Thin-Film Transistor-Organic Light Emitting Diode Burn-In. Sensors 2021, 21, 3182. Park, S.; Park, K.-H.; Chang, J.-H. Luminance-Degradation Compensation Based on Multistream Self-Attention to Address Thin-Film Transistor-Organic Light Emitting Diode Burn-In. Sensors 2021, 21, 3182.

Journal reference: Sensors 2021, 21, 3182
DOI: 10.3390/s21093182

Abstract

In this study, we propose a deep learning algorithm that directly compensates for luminance degradation owing to the deterioration of organic light emitting diode (OLED) devices to address the burn-in phenomenon of OLED displays. Conventional compensation circuits are encumbered by a high cost of development and manufacturing processes owing to their complexity. However, given that deep learning algorithms are typically mounted on a system on chip (SoC), the complexity of the circuit design is reduced, and the circuit can be reused by re-learning only the changed characteristics of the new pixel device. The proposed approach comprises deep feature generation and multi-stream self-attention, which decipher the importance of the variables, and the correlation between burn-in-related variables. It also utilizes a deep neural network that identifies the nonlinear relationship between the extracted features and luminance degradation. Thereafter, the luminance degradation is estimated from the burn-in-related variables, and the burn-in phenomenon can be addressed by compensating for the luminance degradation. The experimental results revealed that compensation was successfully achieved within an error range of 2.69%, and demonstrate the potential of a new approach that can mitigate the burn-in phenomenon by directly compensating for pixel-level luminance deviation.

Keywords

thin film transistor (TFT); organic light emitting diode (OLED); compensation circuit; luminance degradation; artificial intelligence; deep neural network; convolutional neural networks

Subject

MATHEMATICS & COMPUTER SCIENCE, Artificial Intelligence & Robotics

Comments (0)

We encourage comments and feedback from a broad range of readers. See criteria for comments and our diversity statement.

Leave a public comment
Send a private comment to the author(s)
Views 0
Downloads 0
Comments 0
Metrics 0


×
Alerts
Notify me about updates to this article or when a peer-reviewed version is published.
We use cookies on our website to ensure you get the best experience.
Read more about our cookies here.