Preprint Article Version 1 This version is not peer-reviewed

Contactless In-Situ Electrical Characterization Method of Printed Electronic Devices with Terahertz Spectroscopy

Version 1 : Received: 20 November 2018 / Approved: 21 November 2018 / Online: 21 November 2018 (07:36:26 CET)
Version 2 : Received: 28 January 2019 / Approved: 28 January 2019 / Online: 28 January 2019 (10:39:28 CET)

A peer-reviewed article of this Preprint also exists.

Zhuldybina, M.; Ropagnol, X.; Trudeau, C.; Bolduc, M.; Zednik, R.J.; Blanchard, F. Contactless In Situ Electrical Characterization Method of Printed Electronic Devices with Terahertz Spectroscopy. Sensors 2019, 19, 444. Zhuldybina, M.; Ropagnol, X.; Trudeau, C.; Bolduc, M.; Zednik, R.J.; Blanchard, F. Contactless In Situ Electrical Characterization Method of Printed Electronic Devices with Terahertz Spectroscopy. Sensors 2019, 19, 444.

Journal reference: Sensors 2019, 19, 444
DOI: 10.3390/s19030444

Abstract

Printed electronic devices are attracting significant interest due to their versatility and low cost; however, quality control during manufacturing is a significant challenge preventing the widespread adoption of this promising technology. We show that terahertz radiation can be used for the in-situ inspection of printed electronic devices, as confirmed through a comparison with conventional electrical conductivity methods. Our in-situ method consists in printing a simple test pattern exhibiting a distinct signature in the THz range that enables the precise characterization of electrical conductivities of the printed ink. We demonstrate that contactless dual-wavelength THz spectroscopy analysis, which requires only a single THz measurement, is more precise and repeatable than the conventional four-point probe conductivity measurement method. Our results open the door to a simple strategy for performing contactless quality control in real time of printed electronic devices at any stage of its production line.

Subject Areas

printed electronics; inkjet printinh; terahertz time domain spectroscopy; vortex phase plate; vortex beam

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