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Preprint ARTICLE | doi:10.20944/preprints202311.1639.v1

A high-flux compact X-ray free-electron laser for next-generation chip metrology needs

James B. Rosenzweig, Gerard Andonian, Ronald Agustsson, Petr M. Anisimov, Aurora Araujo, Fabio Bosco, Martina Carillo, Enrica Chiadroni, Luca Giannessi, Zhirong Huang, Atsushi Fukasawa, Dongsung Kim, Sergey Kutsaev, Gerard Lawler, Zenghai Li, Nathan Majernik, Pratik Manwani, Jared Maxson, John Miao, Mauro Migliorati, Andrea Mostacci, Pietro Musumeci, Alex Murokh, Emilio Nanni, Sean O’Tool, Luigi Palumbo, River Robles, Yusuke Sakai, Evgenya I. Simakov, Madison Singleton, Bruno Spataro, Jingyi Tang, Sami Tantawi, Oliver Williams, Haoran Xu, Monika Yadav

Subject: Physical Sciences, Applied Physics Keywords: metrology; semiconductor; ptychography; laminography; free-electron laser; photoinjector; beam dynamics; undulator; coherence; x-ray

Online: 28 November 2023 (01:41:43 CET)

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Preprint ARTICLE | doi:10.20944/preprints202401.0195.v1

Digital Miniature Cathode Ray Magnetometer

Marcos Turqueti, Gustav Wagner, Azriel Goldschmidt, Rebecca Carney

Subject: Engineering, Electrical And Electronic Engineering Keywords: Magnetometer; Magnetic Probe; Imager; Cathode Ray; Undulator; DSP; CMOS sensor; Cryo-genic; Cold Electronics; Magnetoencephalography

Online: 4 January 2024 (03:38:17 CET)

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