ARTICLE
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doi:10.20944/preprints201901.0244.v1
Subject:
Chemistry And Materials Science,
Surfaces, Coatings And Films
Keywords:
XRF; X-ray fluorescence; thickness determination; thin film; simulation; XMI-MSIM; electrodeposition; Monte Carlo; galvanic industry; electroplating
Online: 24 January 2019 (08:09:27 CET)