The lattice reduction aided(LRA) algorithm has attracted widely attention of researchers in MIMO systems because of its low complexity to achieve full diversity. However, most lattice reduction auxiliary algorithms do not directly improve system performance. In this paper, a modified lattice reduction successive interference cancellation (SIC) algorithm is proposed for MIMO OFDM system mild changing the complexity of LRA algorithm. At present, the MMSE SQRD algorithm has the problem of regarding too much useful signals as the residual interference which cannot be cancelled by successive interference cancellation. Since the diagonal elements of useful signals are non-zero, the components of the symbols to be detected still present in the interference term, treating all the signals as interference will be resulted in performance loss. To solve this problem, the modified matrix is proposed.by moving this symbol component into the signal term, the proposed algorithm can provide the better performance than MMSE SQRD algorithm. The analysis shows that the LRA-MMSE-SIC algorithm of proposed in this paper significantly improves the system performance with mild increasing the complexity. The simulation results show that the performance of the proposed algorithm is improved by 1dB and 8dB compared with the comparison algorithm when the bit error rate is 10−3.

In this paper, a novel integrated high precision vacuum microelectronic accelerometer is put forward based on the theory of field emission, the accelerometer consists of sensitive structure and interface ASIC. The sensitive structure has a mass of a cathode cone tips array, a folded beam, an emitter electrode and a feedback electrode. The sensor is fabricated on a double side polished (1 0 0) N-type silicon wafer, the tips array of cathode are shaped by wet etching with HNA (HNO3, HF and CH3COOH) and metalized by TiW/Au thin film. The structure of sensor is released by ICP process finally. The interface ASIC was designed and fabricated based on the P-JFET high voltage bipolar process. The accelerometer is tested through static field rollover test, and the test results show the integrated vacuum microelectronic accelerometer has good performances, which sensitivity is 3.081V/g and non-linearity is 0.84% in the measuring range of −1g~1g.