This study utilized electron back scattered diffraction (EBSD) and X-ray diffraction (XRD) to investigate the impact of inter-annealing temperature and heating rate of final annealing on the microstructure of high-voltage anode aluminum foils. The findings indicate that the formation of cube texture in the final products is significantly influenced by the inter-annealing temperature, as low inter-annealing temperatures retain a considerable amount of deformation stored energy, providing a strong driving force for nucleation. The cube texture is observed to deviate from the ideal position at lower inter-annealing temperatures. Additionally, an increase in heating rate during final annealing leads to a gradual decrease in the fraction and grain size of recrystallization. This is attributed to the fact that a higher heating rate (below the critical heating rate) reduces the time available for grain boundary migration, thereby slowing the recrystallization process.