Submitted:
28 December 2024
Posted:
31 December 2024
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Abstract
Keywords:
1. Introduction
2. Selective Assembly Employing Multiple-Slot Rows in Flow Production Systems
2.1. Selective Assembly Process
- Outer ring raceway diameter: A = 40.017 ± 0.020 mm;
- Inner ring raceway diameter: B = 24 ± 0.010 mm;
- Ball diameter: C = 8 ± 0.0005 mm;
- Assembly clearance: Y = 0.017 ± 0.005 mm.
- Outer ring raceway diameter tolerance: A = ±20 μm;
- Inner ring raceway diameter tolerance: B = ±10 μm;
- Ball diameter tolerance: C = ±0.5 μm;
- Assembly clearance tolerance: Y = ±5 μm.
2.2. Cause of Surplus Parts
3. PPS Algorithm
| Function: SortBySimilarity |
| 1 function SortBySimilarity (array X) 2 n ← length(X) 3 initialize S[1…n] 4 sort X in ascending 5 for i ← 2…n–1 do 6 S[i] ← X[i + 1]–X[i–1] 7 end for 8 S[1] ← 2 × (X[2]–X[1]) 9 S[n] ← 2 × (X[n]–X[n–1]) 10 sort X by S in ascending 11 return X 12 end function |
| Algorithm: Predominance Preferential Selection |
| 1 A ← array of measurements of parts A 2 B ← array of measurements of parts B 3 strideA ← stride for array A 4 strideB ← stride for array B 5 A ← SortBySimilarity(A) 6 B ← SortBySimilarity(B) 7 n ← length(A) 8 m ← length(B) 9 initialize empty list P 10 for i ← 1…n do 11 for j ← 1…m do 12 p ← quotient(i / strideA) + quotient(j / strideB) 13 if p ≥ length(P), then 14 add empty list to P 15 end if 16 add tuple (i, j) to P[p] 17 end for 18 end for 19 initialize empty list Q 20 for block in P do 21 for i, j in block do 22 r ← dimension when A[i] and B[j] are assembled 23 if r satisfies tolerance, then 24 e ← absolute of error between r and ideal dimension 25 add tuple (e, i, j) to Q 26 end if 27 end for 28 if Q is not empty then 29 break 30 end if 31 end for 32 select A[i], B[j] by i, j, where minimum e is from Q |
4. Performance Evaluation and Results
4.1. Testing Environment Evaluation Criteria
- 1.
- Computation time: it should be minimized to avoid time delay from combination selection to assembly.
- 2.
- Matching rate: whenever the process cycle is in progress, either the matching or the unmatching count increases, depending on whether the right group has been found. The matching rate is the percentage of the matching and unmatching ratios.
- 3.
- Cpk: Cpk (adjusted process capability index) is used to evaluate the consistency and quality of the assembled product according to the following equations:
- USL: upper specification limit
- LSL: lower specification limit
- σ: standard deviation
- µ: clearance mean
- 4.
- Adjusted matching rate: This metric indicates the probability of defective components identified at the end of the process clearance stage, accounting for the inherent mechanical limitations. Due to limitations in the sensor accuracy, some dimensional errors in individual components may not be detected, which cannot be directly observed. To estimate this, potential errors (e.g., sensor errors, ball diameter errors, etc.) are randomly generated following a normal distribution and added to the process clearance variance. This simulates the latent errors during the process. Then, the adjusted matching rate, which represents the probability of a potential error, is calculated for a low Cpk considering the number of components that fall outside the clearance specification limits after incorporating these potential errors.
4.2. Simulation Results
5. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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| Ordinary algorithm | PPS (Stride 5-3) |
PPS (Stride 2-2) |
|
| Computation time [ms] | 0.060 ± 0.237 | 0.022 ± 0.150 | 0.010 ± 0.099 |
| Matching rate [%] | 95.11 | 96.54 | 97.09 |
| Cpk | 1.76 | 1.43 | 1.15 |
| Adjusted matching rate [%] | 95.10 | 96.50 | 97.00 |
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