Preprint Review Version 1 This version is not peer-reviewed

Recent Progressive Use of Advanced Atomic Force Microscopy in Polymer Science: A Review

Version 1 : Received: 5 March 2020 / Approved: 5 March 2020 / Online: 5 March 2020 (04:03:23 CET)

How to cite: Nguyen-Tri, P.; Ghassemin, P.; Carriere, P.; Assadi, A.A.; Nguyen, D.D. Recent Progressive Use of Advanced Atomic Force Microscopy in Polymer Science: A Review. Preprints 2020, 2020030082 (doi: 10.20944/preprints202003.0082.v1). Nguyen-Tri, P.; Ghassemin, P.; Carriere, P.; Assadi, A.A.; Nguyen, D.D. Recent Progressive Use of Advanced Atomic Force Microscopy in Polymer Science: A Review. Preprints 2020, 2020030082 (doi: 10.20944/preprints202003.0082.v1).

Abstract

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. In this perspective paper, we review recent progress in the use of AFM-IR in polymer science. We describe first the principle of AFM-IR and the recent improvements to enhance its resolution. We discuss then the last progress in the use of AFM-IR as a super-resolution correlated scanned-probe IR spectroscopy for chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers and biopolymers. To highlight the advantages of AFM-IR, we report here several results in studying crystallization of both miscible and immiscible blends as well as polymer aging. Then, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure and crystallization mechanisms at the nanoscale, which have never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

Subject Areas

ARM-IR; polymers; polymer blends; polymer aging; nanoscale characterization

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