Working Paper Article Version 1 This version is not peer-reviewed

An Electronic Skin Readout System for Liquid Metal based Flexible Resistor Sensor Array

Version 1 : Received: 23 January 2020 / Approved: 24 January 2020 / Online: 24 January 2020 (14:49:03 CET)

How to cite: Zhang, H.Q.; Teoh, J.C.; Wu, J.F.; Yu, L.; Wang, R.; Francis, D.M.; Lim, C.T. An Electronic Skin Readout System for Liquid Metal based Flexible Resistor Sensor Array. Preprints 2020, 2020010286 Zhang, H.Q.; Teoh, J.C.; Wu, J.F.; Yu, L.; Wang, R.; Francis, D.M.; Lim, C.T. An Electronic Skin Readout System for Liquid Metal based Flexible Resistor Sensor Array. Preprints 2020, 2020010286

Abstract

Liquid metal alloy, incorporated with microfluidic manipulation, has become a promising candidate for flexible resistive sensor array (RSA) that can imitate the functions of human skin. One advantage of RSA with shared rows and shared columns is to reduce the number of wires from M × N to M + N (rows: M and columns: N) and hence to greatly lessen the complexity and burden on the electrical system. The associated drawback is the crosstalk effect between adjacent elements during measurement. Although many literatures have reported several methods to resolve this limitation, almost all of them focus only on the high resistance value (≥100 Ω) RSA. There is a lack of detailed experimental data that addresses low resistance RSA with sensing elements below 100 Ω. Here, we aim to fill the gap of this field. We established two common RSA readout systems, i.e. zero potential methods (ZPM) (setting non-scanned-sampling-electrode zero potential (S-NSSE-ZP) and setting non-scanned-sampling-electrode zero potential with amplifier (S-NSSE-ZP-A)) and to compare their performances in low resistance value (≤100 Ω) RSA. For ideal resistor RSA, the measurement results show that S-NSSE-ZP has at least one time higher error than S-NSSE-ZP-A.

Keywords

Resistive sensor array; measurement error; zero potential methods; liquid metal; flexible electrical skin

Subject

Engineering, Electrical and Electronic Engineering

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