preprints.org > materials science > other > doi: 10.20944/preprints201609.0125.v1

Preprint Article Version 1 Preserved in Portico This version is not peer-reviewed

Version 1 : Received: 30 September 2016 / Approved: 30 September 2016 / Online: 30 September 2016 (09:40:28 CEST)
Version 2 : Received: 18 October 2016 / Approved: 18 October 2016 / Online: 18 October 2016 (08:19:48 CEST)

GaN ultraviolet photodetector with metal-semiconductor-metal structure is achieved by growing on a periodic trapezoid column-shape patterned sapphire substrate using metalorganic chemical vapor deposition. Under 5-V reverse bias, the photodetector fabricated on such patterned sapphire substrate exhibits a lower dark current, a higher photocurrent, and a 476 % enhancement in the maximum responsivity as compare with those of the photodetector fabricated on conventional flat sapphire substrate. It is also found that the much larger UV-to-visible rejection ratio and the fact that responsivity drops in a smaller cut-off region are observed from photodetector fabricated by using a periodic trapezoid column-shape patterned sapphire substrate. These phenomena may all be attributed to the reduction of threading dislocation density and the improved quality of GaN film, as well as the internal reflection and/or scattering effect on the interface between GaN film and the periodic trapezoid column-shape pattern of the substrate.

GaN ultraviolet photodetector; periodic trapezoid column-shape patterned sapphire substrate; responsivity; UV-to-visible rejection ratio

MATERIALS SCIENCE, Other