Submitted:
02 December 2025
Posted:
03 December 2025
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Abstract
Keywords:
1. Introduction
1.1. Motivations
1.2. Research Contributions
- FPGA-Based Design and Implementation of RO PUF: The study successfully implemented a configurable RO PUF architecture on an FPGA platform. A dedicated testbench was developed to acquire large-scale challenge–response datasets under controlled operating conditions, verifying the reproducibility and uniqueness of the PUF behavior across multiple FPGA instances.
- Comprehensive Evaluation of PUF Metrics: The implemented RO PUF was analyzed using standard performance metrics such as uniformity, uniqueness, and reliability (intra-Hamming distance). The proposed design demonstrated balanced uniformity near the ideal 50%
- Machine Learning-Based Attack and Accuracy Estimation: To assess the resilience of the proposed RO PUF against modeling attacks, various ML algorithms, including Logistic Regression (LR), Support Vector Machine (SVM), Multilayer Perceptron (MLP), and K-Nearest Neighbor (KNN), were employed. Confusion matrix analysis revealed that linear models, such as LR, failed to capture the nonlinear challenge–response relationship, while nonlinear models (SVM, MLP, and KNN) performed moderately better but exhibited trade-offs between precision and recall. The findings confirmed that none of the models achieved strong predictive accuracy, highlighting the robustness and unpredictability of the proposed RO PUF against ML-based cloning attempts.
- Randomness Validation Using NIST SP 800-22 Tests: The randomness quality of the generated CRP responses was validated using the NIST statistical test suite, covering tests such as frequency, runs, block frequency, and cumulative sums. The majority of the tests yielded p-values greater than 0.01, confirming that the PUF outputs exhibit strong statistical randomness and are suitable for cryptographic and authentication applications.
2. Related Works
3. Physical Unclonable Functions (PUFS)
3.1. PUFs Classification
3.2. RO PUFs
| Algorithm 1 Ring Oscillator PUF (RO-PUF) Algorithm |
|
3.3. PUF Performance Metrices
- Uniqueness: It is used to quantify how different devices respond to the same input challenge. In other words, it is defined as the inter device Hamming Distance (HD) between different devices and its ideal value is 50%. The HD of equation 7 estimates the uniqueness of CRPs, where n is the total number of devices, and are the respective responses of the and devices under the same challenge, is the Hamming Distance operator, and m is the bit length of each response.
- Uniformity: It is the probability that the 0s and 1s are uniformly distributed in PUF’s response. Uniformity measures the balance between zeros and ones in the responses generated by a PUF. It is obtained by computing the average Hamming weight of the responses, as expressed in equation 8.
-
Reliability: It indicates the ability of a PUF to reproduce the same response bit for a given challenge input even when environmental conditions, such as supply voltage and temperature, vary. An ideal reliability close to 100% means that no bit flips occur across repeated measurements. However, achieving perfect reliability is difficult because PUF outputs are inherently sensitive to these variations.A standard metric for reliability is the intra-class Hamming Distance, is illustrated in equation 9, where R and R’ are two responses from the same device under the same challenge.
- Bit aliasing: It complements uniqueness and uniformity by verifying whether a given bit exhibits enough variation. Ideally, each bit appears randomly as 0 or 1 with a typical value of 50%, signifying minimal bias. The aliasing factor for the bit is represented in equation 10, where is the bit of the device’s response.
- Bit Error Rate (BER): A BER defined in equation 11, gives an estimates of how often a PUF produces incorrect or flipped bits when the same challenge input is applied multiple times under varying environmental conditions such as temperature and supply voltage.
- Entropy: It is used to evaluate the overall randomness of PUF outputs, particularly against advanced modeling attacks and side channel attacks. A higher entropy value reflects a larger and more unpredictable response space. The most widely used metric for this purpose is the Shannon entropy, defined as follows in equation 12:where represents every possible output pattern, and denotes the probability associated with each pattern [39].
3.4. ML Modelling Attacks
4. Experimental Setup and Implementation
4.1. NIST Randomness Test
- Bits: Analyzes characteristics such as proportion of bits, frequency of bit changes, and cumulative sums.
- m-bit blocks: Analyzes distribution of m-bit blocks () within the sequence or its parts.
- M-bit parts: Analyzes complex properties of M-bit parts (), such as matrix rank, sequence spectrum, or linear complexity.
4.1.1. Brief Description of NIST Randomness Tests
- Frequency (Monobit) test: Checks whether the number of ones and zeros are approximately equal.
- Frequency within a block test: Evaluates proportion of zeros and ones in M-bit blocks; expected frequency of ones is .
- Runs test: Measures consecutive runs of zeros and ones; checks if transitions occur at expected frequencies.
- Longest run of ones in a block test: Examines if the longest run of ones (and zeros) in M-bit blocks matches the expected distribution.
- Random binary matrix rank test: Evaluates the rank of sub-matrices to detect linear dependencies in the sequence.
- Discrete Fourier Transform (Spectral) test: Detects periodic features using DFT peak heights.
- Non-overlapping template matching test: Detects excessive occurrences of aperiodic m-bit patterns using a sliding window that resets after each match.
- Overlapping template matching test: Counts occurrences of target substrings; window slides by one bit to allow overlaps.
- Maurer’s Universal Statistical test: Measures compressibility of the sequence; overly compressible sequences indicate non-randomness.
- Linear complexity test: Estimates the length of the feedback register required to reproduce the sequence; shorter lengths indicate predictability.
- Serial test: Examines frequency of all overlapping m-bit patterns.
- Approximate Entropy test: Compares frequencies of overlapping m-bit and -bit patterns to detect regularity.
- Cumulative Sum (Cusum) test: Evaluates maximal deviation from zero in the cumulative sum of bits mapped to .
- Random Excursions test: Measures the number of cycles with exactly K visits in cumulative sum random walks.
- Random Excursions Variant test: Analyzes frequency of visits to specific states in cumulative sum random walks to detect non-random patterns.
4.1.2. Calibration
-
Timing Calibration: Logic analyzers capture digital signals at high sampling rates ranging from hundreds of MHz to several GHz. However, any misalignment between challenge signals, response outputs, and control clocks can result in corrupted CRPs. The calibration strategies are discussed below.
- i)
- Use a known reference signal, such as the FPGA internal clock or a test pattern generator, to align acquisition channels.
- ii)
- Apply trigger-based synchronization in the logic analyzer to ensure consistent alignment of challenge vectors with corresponding responses.
-
Voltage and Signal Level Calibration:FPGA output signals may degrade due to voltage drop, temperature variations, or I/O mismatches. This can cause the logic analyzer to misinterpret logical ’0’ and ’1’ levels. The calibration techniques adopted are,
- i)
- Adjust threshold voltage levels on the logic analyzer to match FPGA I/O standards (e.g., LVTTL, LVCMOS).
- ii)
- Periodically recalibrate using known test vectors to verify that digital transitions are accurately captured.
-
Environmental Calibration: PUF responses are known to vary with temperature, supply voltage, and device aging. Environmental calibration ensures that CRPs remain stable and consistent under varying conditions. Calibration strategies include,
- i)
- Use environmental profiling, where CRPs are collected across controlled temperature and voltage ranges, followed by applying corrective models.
- ii)
- Apply ML-based preprocessing such as normalization or majority voting to compensate for environmental drift.
-
Noise Filtering and Signal Cleaning:High-frequency noise or transient glitches can distort CRP acquisition and lead to unstable datasets. Techniques used in noise filtering and signal conditioning are,
- i)
- Apply digital filtering techniques (e.g., glitch removal, debouncing) during data preprocessing.
- ii)
- Perform repeated measurements followed by majority voting to ensure transient noise does not bias the dataset.
-
Data Alignment and Synchronization: During multi-channel CRP acquisition, timing skew between channels can lead to incorrect challenge-response mapping. The calibration methods used for data alignment and synchronization include,
- i)
- Perform multi-channel skew calibration by applying the same known signal to all acquisition channels and adjusting offsets accordingly.
- ii)
- Use post-processing alignment algorithms to re-synchronize challenge-response mapping before ML training.
-
Statistical Calibration for ML Training: Before feeding CRPs into machine learning models, statistical calibration ensures data integrity and uniformity for reliable analysis. The calibration techniques include,
- i)
- Compute intra-class and inter-class metrics to evaluate the reliability and uniqueness of CRPs.
- ii)
- Apply whitening techniques (e.g., Linear Feedback Shift Register (LFSR) or hash-based methods) to eliminate bias in raw PUF data.
- iii)
- Normalize datasets to prevent ML models from being influenced by imbalanced or skewed response distributions.
5. Results and Discussion
| Algorithm | 25K | 26K | 27K | 28K | 29K | 30K | 31K | 32K | 33K | 34K | 35K |
|---|---|---|---|---|---|---|---|---|---|---|---|
| SVM | 52.7 | 51.27 | 53.46 | 55.71 | 56.81 | 57.65 | 59.02 | 59.94 | 59.94 | 58.44 | 57.43 |
| LR | 52.68 | 51.85 | 53.09 | 54.66 | 56.16 | 57.27 | 58.82 | 59.56 | 59.91 | 57.9 | 56.96 |
| MLP | 52.17 | 51.77 | 53.46 | 55.71 | 56.81 | 57.65 | 59.02 | 59.94 | 59.94 | 58.44 | 57.43 |
| KNN | 51.94 | 48.87 | 50.19 | 50.30 | 54.28 | 49.43 | 54.16 | 55.91 | 51.18 | 53.6 | 52.19 |
5.1. Randomness Results
5.2. Correlation Matrix
5.3. Receiver Operating Characteristic (ROC)
6. Conclusion
Author Contributions
Funding
Conflicts of Interest
Abbreviations
| AI | Artificial Intelligence |
| AUC | Area Under the Curve |
| CEC | Collaborative Edge Computing |
| CRPs | Challenge Response Pairs |
| DDoS | Distributed Denial of Service |
| DT | Decision Trees |
| EC | Edge Computing |
| FN | False Negatives |
| FP | False Positives |
| FPGAs | Field Programmable Gate Arrays |
| ICs | Integrated Circuits |
| IDS | Intrusion Detection Systems |
| IoT | Internet of Things |
| IP | Intellectual Property |
| KNN | K-Nearest Neighbor |
| LR | Logistic Regression |
| LSTM | Long Short-Term Memory |
| MiTM | Man in the Middle |
| ML | Machine Learning |
| MLP | Multilayer Perceptron |
| NIST | National Institute of Standards and Technology |
| PUF | Physical Unclonable Function |
| RF | Random Forests |
| RO | Ring Oscillator |
| STS | Statistical Test Suite |
| SVM | Support Vector Machine |
| TN | True Negatives |
| TP | True Positives |
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| Article | KNN | SVM | MLP | RF | DT | LR |
|---|---|---|---|---|---|---|
| [29] | 56.76 – 63.24 | 49.76 - 69.71 | 50.10 -70.86 | 62.67 – 75.81 | 57.90 – 72.00 | |
| [30] | 49.75 | 63.13 | 49.63 | |||
| [31] | 74.6 | 66.2 | 72.3 | 64.6 | ||
| [35] | 56.64 | 58.04 | 51.9 | |||
| [36] | 58.59 – 61.95 |
| # | Name of the Test | n | M or m | Sub-Test # |
|---|---|---|---|---|
| 1 | Frequency | – | 1 | |
| 2 | Frequency within a block | 1 | ||
| 3 | Runs | – | 1 | |
| 4 | Longest run of ones | – | 1 | |
| 5 | Rank | – | 1 | |
| 6 | Spectral | – | 1 | |
| 7 | Non-overlapping Template Matching | 148 | ||
| 8 | Overlapping Template Matching | – | 1 | |
| 9 | Maurer’s Universal | – | 1 | |
| 10 | Linear Complexity | 1 | ||
| 11 | Serial | – | 2 | |
| 12 | Approximate Entropy | – | 1 | |
| 13 | Cumulative Sums | – | 2 | |
| 14 | Random Excursions | – | 8 | |
| 15 | Random Excursions variant | – | 18 |
| Reference | Uniqueness | Uniformity | Reliability | Description |
|---|---|---|---|---|
| [45] | 47.64%, 45.15% | 49.8%, 48% | 98.5%, 96% | RO PUF using three and five stage oscillators on Artix seven FPGA with XOR and inverter logic. |
| [46] | 50.1% | 49.45% | 98.33% | CLU-based design using XOR and XNOR to create a low hardware CRO PUF. |
| [47] | 49.23% | 49.76% | 98.05% | A lightweight configurable RO PUF that combines RRAM with CMOS inverters. |
| [48] | 48.64% | 46.78% | 86% | Strong RO PUF (BST RPUF) designed for improved CRP count and stable responses. |
| [49] | 49.2% | 49.8% | 97.6% | RO PUF design used as a hardware security primitive for IoT applications. |
| [50] | 44.46%, 47.33%, 47.48% | 59.61%, 60.62%, 62.89% | 97.96%, 98.09%, 99.16% | Uses one hundred RO blocks with five, eleven, and twenty stages for response generation. |
| [48] | 48.64% | 46.78% | BER < | Highly reliable BST RPUF robust against ML-based modeling attacks. |
| This work | 49.1% | 56.86% | 60.13% | A configurable RO PUF architecture is implemented on an FPGA platform and its resilience against ML attacks is measured. |
| Tests | p-values |
|---|---|
| Block Frequency | 0.444570 |
| Cumulative sums | 0.907298 |
| FFT | 0.561658 |
| Frequency Test | 0.583604 |
| Runs | 0.677681 |
| Longest run of ones | 0.164698 |
| Rank | 0.945607 |
| Non overlapping Template matching | 0.51082702 (Average) |
| Overlapping template matching | 0.711526 |
| Universal statistical | 0.829717 |
| Approximate entropy | 0.120839 |
| Random excursions | 0.332701 |
| Random excursions variant | 0.447202222 |
| Serial test | 0.2013255 |
| Linear complexity | 0.420000 |
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