Version 1
: Received: 21 September 2023 / Approved: 22 September 2023 / Online: 25 September 2023 (11:44:59 CEST)
How to cite:
Suzuki, K.; Negishi, T.; Kato, Y.; Kono, Y.; Sekimoto, M. Study of the Calibration of Semiconductor Survey Meters Using Medical X-ray Equipment. Preprints2023, 2023091575. https://doi.org/10.20944/preprints202309.1575.v1
Suzuki, K.; Negishi, T.; Kato, Y.; Kono, Y.; Sekimoto, M. Study of the Calibration of Semiconductor Survey Meters Using Medical X-ray Equipment. Preprints 2023, 2023091575. https://doi.org/10.20944/preprints202309.1575.v1
Suzuki, K.; Negishi, T.; Kato, Y.; Kono, Y.; Sekimoto, M. Study of the Calibration of Semiconductor Survey Meters Using Medical X-ray Equipment. Preprints2023, 2023091575. https://doi.org/10.20944/preprints202309.1575.v1
APA Style
Suzuki, K., Negishi, T., Kato, Y., Kono, Y., & Sekimoto, M. (2023). Study of the Calibration of Semiconductor Survey Meters Using Medical X-ray Equipment. Preprints. https://doi.org/10.20944/preprints202309.1575.v1
Chicago/Turabian Style
Suzuki, K., Yasuhisa Kono and Michiharu Sekimoto. 2023 "Study of the Calibration of Semiconductor Survey Meters Using Medical X-ray Equipment" Preprints. https://doi.org/10.20944/preprints202309.1575.v1
Abstract
In recent years, semiconductor survey meters have been developed and are in increasing demand worldwide. This study aimed to investigate whether it is possible to calculate the time constant of the semiconductor survey meter using the X-ray equipment installed in each medical facility and whether it is possible to calibrate the semiconductor survey meter. Attach an additional filter to the medical X-ray system to satisfy the standards of N-60 to N-120, add more copper plates from there, and calculate the first and second half-value layers to compare with N-60 to N-120 values. Next, we will measure the leakage dose using a medical X-ray system and calculate the time constant of the survey meter. The survey meter is then calibrated and compared with the calibration factors in industrial X-ray system. Per experimental results, it is possible to reproduce the N-60 to N-120 radiation quality using a medical X-ray system and to calculate the time constant from the measured results assuming actual leakage dosimetry using that radiation quality. We also found that the calibration factor was equivalent to that of an industrial X-ray device. It was revealed that semiconductor survey meters can be calibrated using a medical X-ray system.
Keywords
semiconductor survey meter; calibration; medical X-ray system; calibration factor; time constant
Subject
Physical Sciences, Radiation and Radiography
Copyright:
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
