We demonstrate a concept and fabrication of lithography-free layered metal-\ce{SiO2} thin-film structures which have reduced reflectivity (black appearance), to as low as 0.9~\%, with 4.9~\% broadband reflectance (8.9~\% for soda lime) in the 500 - 1400~nm range. The multi-layered (four layers) thin-film metamaterial is designed so that optical impedance matching produces minimal reflectance and transmittance within the visible and infra-red (IR) spectral region for a range of incident angles. The structure has enhanced absorbance and is easily tuned for reduced minimal transmission and reflection.